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MW6S010 PDF预览

MW6S010

更新时间: 2024-01-07 06:52:36
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飞思卡尔 - FREESCALE 晶体晶体管功率场效应晶体管射频
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16页 541K
描述
RF Power Field Effect Transistor

MW6S010 数据手册

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Document Number: MW6S010  
Rev. 1, 5/2005  
Freescale Semiconductor  
Technical Data  
RF Power Field Effect Transistor  
N-Channel Enhancement-Mode Lateral MOSFETs  
Designed for Class A or Class AB base station applications with frequencies  
up to 1500 MHz. Suitable for analog and digital modulation and multicarrier  
amplifier applications.  
MW6S010NR1  
MW6S010GNR1  
MW6S010MR1  
MW6S010GMR1  
Typical Two-Tone Performance @ 960 MHz, VDD = 28 Volts, IDQ  
125 mA, Pout = 10 Watts PEP  
Power Gain — 18 dB  
=
Drain Efficiency — 32%  
IMD — -37 dBc  
Capable of Handling 10:1 VSWR, @ 28 Vdc, 960 MHz, 10 Watts CW  
Output Power  
450-1500 MHz, 10 W, 28 V  
LATERAL N-CHANNEL  
BROADBAND RF POWER MOSFETs  
Characterized with Series Equivalent Large-Signal Impedance Parameters  
On-Chip RF Feedback for Broadband Stability  
Qualified Up to a Maximum of 32 VDD Operation  
Integrated ESD Protection  
N Suffix Indicates Lead-Free Terminations  
200°C Capable Plastic Package  
In Tape and Reel. R1 Suffix = 500 Units per 24 mm, 13 inch Reel.  
CASE 1265-08, STYLE 1  
TO-270-2  
PLASTIC  
MW6S010NR1(MR1)  
CASE 1265A-02, STYLE 1  
TO-270-2 GULL  
PLASTIC  
MW6S010GNR1(GMR1)  
Table 1. Maximum Ratings  
Rating  
Symbol  
Value  
Unit  
Vdc  
Vdc  
Drain-Source Voltage  
Gate-Source Voltage  
V
-0.5, +68  
-0.5, +12  
DSS  
V
GS  
Total Device Dissipation @ T = 25°C  
Derate above 25°C  
P
61.4  
0.35  
W
W/°C  
C
D
Storage Temperature Range  
Operating Junction Temperature  
T
- 65 to +175  
200  
°C  
°C  
stg  
T
J
Table 2. Thermal Characteristics  
(1.2)  
Characteristic  
Symbol  
Value  
Unit  
Thermal Resistance, Junction to Case  
R
θ
JC  
°C/W  
Case Temperature 80°C, 10 W PEP  
2.85  
1. MTTF calculator available at http://www.freescale.com/rf. Select Tools/Software/Application Software/Calculators to access  
the MTTF calculators by product.  
2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.  
Select Documentation/Application Notes - AN1955.  
NOTE - CAUTION - MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and  
packaging MOS devices should be observed.  
Freescale Semiconductor, Inc., 2005. All rights reserved.  

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