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MURD320_04 PDF预览

MURD320_04

更新时间: 2024-11-01 04:08:39
品牌 Logo 应用领域
安森美 - ONSEMI /
页数 文件大小 规格书
4页 65K
描述
ULTRAFAST RECTIFIER 3.0 AMPERES, 200 VOLTS

MURD320_04 数据手册

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MURD320  
Preferred Device  
SWITCHMODEt  
Power Rectifier  
DPAK Surface Mount Package  
http://onsemi.com  
These state−of−the−art devices are designed for use in switching  
power supplies, inverters and as free wheeling diodes.  
ULTRAFAST RECTIFIER  
3.0 AMPERES, 200 VOLTS  
Features  
Pb−Free Package is Available  
Ultrafast 35 Nanosecond Recovery Time  
Low Forward Voltage Drop  
Low Leakage  
1
4
3
Mechanical Characteristics  
Case: Epoxy, Molded  
Weight: 0.4 Gram (Approximately)  
Finish: All External Surfaces Corrosion Resistant and Terminal  
Leads are Readily Solderable  
MARKING  
DIAGRAM  
Lead and Mounting Surface Temperature for Soldering Purposes:  
260°C Max. for 10 Seconds  
4
YWW  
U
320  
DPAK  
CASE 369C  
Available in 16 mm Tape and Reel, 2500 Units Per Reel,  
by Adding a “T4’’ Suffix to the Part Number  
2
1
3
Y
WW  
= Year  
= Work Week  
MAXIMUM RATINGS  
Rating  
Symbol  
Value  
Unit  
Peak Repetitive Reverse Voltage  
Working Peak Reverse Voltage  
DC Blocking Voltage  
V
V
V
200  
V
RRM  
RWM  
R
ORDERING INFORMATION  
Average Rectified Forward Current  
I
3.0  
6.0  
A
A
F(AV)  
Device  
Package  
Shipping  
(Rated V , T = 158°C)  
R
C
Peak Repetitive Forward Current  
(Rated V , Square Wave,  
I
FRM  
MURD320T4  
DPAK  
2500/Tape & Reel  
2500/Tape & Reel  
R
MURD320T4G  
DPAK  
20 kHz, T = 158°C)  
C
(Pb−Free)  
Non−Repetitive Peak Surge Current  
(Surge Applied at Rated Load  
Conditions Halfwave, 60 Hz)  
I
75  
A
FSM  
†For information on tape and reel specifications,  
including part orientation and tape sizes, please  
refer to our Tape and Reel Packaging Specifications  
Brochure, BRD8011/D.  
Operating Junction and Storage  
Temperature Range  
T , T  
J
−65 to +175  
°C  
stg  
Preferred devices are recommended choices for future use  
and best overall value.  
Maximum ratings are those values beyond which device damage can occur.  
Maximum ratings applied to the device are individual stress limit values (not  
normal operating conditions) and are not valid simultaneously. If these limits  
are exceeded, device functional operation is not implied, damage may occur  
and reliability may be affected.  
Semiconductor Components Industries, LLC, 2004  
1
Publication Order Number:  
August, 2004 − Rev. 4  
MURD320/D  

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