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LP750SOT89-1 PDF预览

LP750SOT89-1

更新时间: 2024-11-28 22:24:11
品牌 Logo 应用领域
FILTRONIC 晶体晶体管放大器
页数 文件大小 规格书
3页 47K
描述
LOW NOISE, HIGH LINEARITY PACKAGED PHEMT

LP750SOT89-1 技术参数

生命周期:Obsolete包装说明:SMALL OUTLINE, R-PSSO-F3
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8541.29.00.75风险等级:5.74
Is Samacsys:N外壳连接:SOURCE
配置:SINGLE最小漏源击穿电压:7 V
FET 技术:HIGH ELECTRON MOBILITY最高频带:L BAND
JESD-30 代码:R-PSSO-F3元件数量:1
端子数量:3工作模式:DEPLETION MODE
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:SMALL OUTLINE极性/信道类型:N-CHANNEL
认证状态:Not Qualified表面贴装:YES
端子形式:FLAT端子位置:SINGLE
晶体管应用:AMPLIFIER晶体管元件材料:GALLIUM ARSENIDE
Base Number Matches:1

LP750SOT89-1 数据手册

 浏览型号LP750SOT89-1的Datasheet PDF文件第2页浏览型号LP750SOT89-1的Datasheet PDF文件第3页 
LP 7 5 0 S OT8 9  
LOW NOIS E, HIGH LINEARITY P ACKAGED P HEMT  
·
·
FEATURES  
¨
¨
¨
¨
¨
26 dBm Output Power at 1-dB Compression at 1.8 GHz  
17 dB Power Gain at 1.8 GHz  
0.7 dB Noise Figure  
40 dBm Output IP3 at 1.8 GHz  
55% Power-Added Efficiency  
DES CRIP TION AND AP P LICATIONS  
The LP750SOT89 is a packaged Aluminum Gallium Arsenide / Indium Gallium Arsenide  
(AlGaAs/InGaAs) pseudomorphic High Electron Mobility Transistor (pHEMT). It utilizes a  
0.25 mm x 750 mm Schottky barrier gate, defined by electron-beam photolithography. The recessed  
“mushroom” gate structure minimizes parasitic gate-source and gate resistance. The epitaxial  
structure and processing have been optimized for reliable high-power applications. The LP750 also  
features Si3N4 passivation and is available in die form or in other packages.  
Typical applications include drivers or output stages in PCS/Cellular amplifiers, WLL and WLAN  
systems, and other types of wireless infrastructure systems.  
·
ELECTRICAL S P ECIFICATIONS @ TAm b ie n t = 2 5 °C  
Parameter  
Saturated Drain-Source Current  
LP750SOT89-1  
Symbol  
Test Conditions  
Min  
Typ  
Max Units  
IDSS  
VDS = 2 V; VGS = 0 V  
180  
231  
24  
230  
265  
mA  
mA  
dBm  
dB  
LP750SOT89-2  
Power at 1-dB Compression  
Power Gain at 1-dB Compression  
Power-Added Efficiency  
P-1dB  
G-1dB  
PAE  
VDS = 5 V; IDS = 50% IDSS  
VDS = 5 V; IDS = 50% IDSS  
26  
17  
55  
15.5  
VDS = 5 V; IDS = 50% IDSS  
;
%
PIN = 10 dBm  
Noise Figure  
NF  
IP3  
VDS = 5 V; IDS = 50% IDSS  
0.7  
40  
dB  
Output Third-Order Intercept Point  
VDS = 5V; IDS = 50% IDSS  
;
dBm  
PIN = -7 dBm  
Maximum Drain-Source Current  
Transconductance  
IMAX  
GM  
VDS = 2 V; VGS = 1 V  
VDS = 2 V; VGS = 0 V  
VGS = -5 V  
450  
220  
5
mA  
mS  
mA  
V
170  
Gate-Source Leakage Current  
Pinch-Off Voltage  
IGSO  
VP  
45  
VDS = 2 V; IDS = 4 mA  
IGS = 4 mA  
-0.25  
-10  
-1.2  
-12  
-2.0  
Gate-Source Breakdown  
Voltage Magnitude  
|VBDGS  
|
V
Gate-Drain Breakdown  
Voltage Magnitude  
|VBDGD  
|
IGD = 4 mA  
-10  
-13  
V
frequency=1.8 GHz  
P h o n e : (408) 988-1845  
Fa x: (408) 970-9950  
h ttp :// www.filss.com  
Re vis e d : 1/18/02  
Em a il: sales@filss.com  

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