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LMH0056SQE/NOPB PDF预览

LMH0056SQE/NOPB

更新时间: 2024-11-12 11:07:59
品牌 Logo 应用领域
德州仪器 - TI 时钟商用集成电路复用器
页数 文件大小 规格书
19页 778K
描述
具有 4:1 输入多路复用器的 HD/SD SDI 时钟恢复器 | RHS | 48 | -40 to 85

LMH0056SQE/NOPB 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active包装说明:HVQCCN, LCC48,.27SQ,20
Reach Compliance Code:compliantECCN代码:5A991.B.4.B
HTS代码:8542.39.00.01Factory Lead Time:1 week
风险等级:1.91Samacsys Description:Analogue & Digital Crosspoint ICs
商用集成电路类型:CONSUMER CIRCUITJESD-30 代码:S-PQCC-N48
JESD-609代码:e3长度:7 mm
湿度敏感等级:3功能数量:1
端子数量:48最高工作温度:85 °C
最低工作温度:-40 °C封装主体材料:PLASTIC/EPOXY
封装代码:HVQCCN封装等效代码:LCC48,.27SQ,20
封装形状:SQUARE封装形式:CHIP CARRIER, HEAT SINK/SLUG, VERY THIN PROFILE
峰值回流温度(摄氏度):260电源:3.3 V
认证状态:Not Qualified座面最大高度:0.8 mm
子类别:Other Consumer ICs最大供电电压 (Vsup):3.465 V
最小供电电压 (Vsup):3.135 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Matte Tin (Sn)端子形式:NO LEAD
端子节距:0.5 mm端子位置:QUAD
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:7 mm

LMH0056SQE/NOPB 数据手册

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LMH0056  
www.ti.com  
SNLS236C AUGUST 2006REVISED APRIL 2013  
LMH0056 HD/SD SDI Reclocker with 4:1 Input Multiplexer  
Check for Samples: LMH0056  
1
FEATURES  
DESCRIPTION  
The LMH0056 HD/SD SDI Reclocker with 4:1 Input  
Multiplexer retimes serial digital video data  
conforming to the SMPTE 292M and SMPTE 259M  
(A & C) standards. The LMH0056 operates at serial  
data rates of 143 Mbps, 270 Mbps, 1.483 Gbps and  
1.485 Gbps. The LMH0056 supports DVB-ASI  
operation at 270 Mbps. The LMH0056 includes an  
integrated 4:1 input multiplexer for selecting one of  
four input data streams for retiming.  
2
Supports SMPTE 292M and SMPTE 259M (A &  
C) Serial Digital Video Standards  
Supports 143 Mbps, 270 Mbps, 1.483 Gbps,  
and 1.485 Gbps Serial Data Rate Operation  
Supports DVB-ASI at 270 Mbps  
Single 3.3V Supply Operation  
360 mW Typical Power Consumption  
Integrated 4:1 Multiplexed Input  
Two Differential, Reclocked Outputs  
The LMH0056 automatically detects the incoming  
data rate and adjusts itself to retime the incoming  
data to suppress accumulated jitter. The LMH0056  
recovers the serial data-rate clock and optionally  
provides it as an output. The LMH0056 has two  
differential serial data outputs; the second output may  
be selected as a low-jitter, data-rate clock output.  
Controls and indicators are: serial clock or second  
serial data output select, manual rate select input,  
SD/HD rate indicator output, lock detect output,  
auto/manual data bypass and output mute. The serial  
data inputs, outputs, and serial data-rate clock  
outputs are differential LVPECL compatible. The CML  
serial data and serial data-rate clock outputs are  
suitable for driving 100differentially terminated  
networks. The control logic inputs and outputs are  
LVCMOS compatible.  
Choice of Second Reclocked Output or Low-  
Jitter, Differential, Data-Rate Clock Output  
Single 27 MHz External Crystal or Reference  
Clock Input  
Manual Rate Select Input  
SD/HD Operating Rate Indicator Output  
Lock Detect Indicator Output  
Output Mute Function for Data and Clock  
Auto/Manual Reclocker Bypass  
Differential LVPECL Compatible Serial Data  
Inputs and Outputs  
LVCMOS Control Inputs and Indicator Outputs  
48-Pin WQFN Package  
The LMH0056 is powered from a single 3.3V supply.  
Power dissipation is typically 360 mW. The device is  
housed in a 48-pin WQFN package.  
Industrial Temperature Range: -40°C to +85°C  
APPLICATIONS  
SDTV/HDTV Serial Digital Video Interfaces for:  
Digital Video Routers and Switchers  
Digital Video Processing and Editing  
Equipment  
DVB-ASI Equipment  
Video Standards and Format Converters  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
2
All trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2006–2013, Texas Instruments Incorporated  

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