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IRFG110 PDF预览

IRFG110

更新时间: 2024-11-20 11:09:35
品牌 Logo 应用领域
SEME-LAB 晶体晶体管开关脉冲
页数 文件大小 规格书
2页 26K
描述
14 LEAD DUAL IN LINE QUAD

IRFG110 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Active包装说明:IN-LINE, R-PDIP-T14
针数:14Reach Compliance Code:compliant
ECCN代码:EAR99风险等级:5.17
其他特性:AVALANCHE ENERGY RATED配置:SEPARATE, 4 ELEMENTS WITH BUILT-IN DIODE
最小漏源击穿电压:100 V最大漏极电流 (ID):1 A
最大漏源导通电阻:0.8 ΩFET 技术:METAL-OXIDE SEMICONDUCTOR
JESD-30 代码:R-PDIP-T14元件数量:4
端子数量:14工作模式:ENHANCEMENT MODE
最高工作温度:150 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:IN-LINE
峰值回流温度(摄氏度):NOT SPECIFIED极性/信道类型:N-CHANNEL
认证状态:Not Qualified表面贴装:NO
端子形式:THROUGH-HOLE端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED晶体管元件材料:SILICON
Base Number Matches:1

IRFG110 数据手册

 浏览型号IRFG110的Datasheet PDF文件第2页 
2N7334  
IRFG110  
MECHANICAL DATA  
Dimensions in mm (inches)  
14 LEAD DUAL IN LINE QUAD  
N-CHANNEL  
19.507 ± 0.432  
(0.768 ± 0.017)  
POWER MOSFETS  
0.457 ± 0.102  
2.134  
(0.084)  
(0.018 ± 0.004)  
BV  
I
±100V  
1A  
DSS  
(cont)  
D
14  
1
8
7
0.7  
R
(on)  
DS  
FEATURES  
• AVALANCHE ENERGY RATED  
• HERMETICALLY SEALED  
• DYNAMIC dv/dt RATING  
1.422 ± 0.102  
(0.056 ± 0.004)  
2.54  
• SIMPLE DRIVE REQUIREMENTS  
• FOR AUTOMATIC INSERTION  
• SIMPLE DRIVE REQUIREMENTS  
• EASE OF PARALLELING  
(0.100)  
14 LEAD MOULDED DIP PACKAGE  
N-CHANNEL N-CHANNEL N-CHANNEL N-CHANNEL  
1—Drain 1 5—Gate 2 8—Drain 3 12—Gate 4  
2—Source 1 6—Source 2 9—Source3 13—Source 4  
3—Gate 1  
7—Drain 2  
10—Gate 3  
14—Drain 4  
• 4 N-CHANNEL CO-PACKAGED HEXFETS  
• LIGHTWEIGHT  
11,4—NC  
ABSOLUTE MAXIMUM RATINGS(Tcase = 25°C unless otherwise stated)  
V
Gate – Source Voltage  
Continuous Drain Current  
Continuous Drain Current  
Pulsed Drain Current  
±20V  
1.A  
GS  
I
I
I
(V = 10V , T  
= 25°C)  
D
GS  
case  
(V = 10V , T  
= 100°C)  
0.6A  
D
GS  
case  
4A  
DM  
P
Power Dissipation @ T = 25°C  
case  
1.4W  
D
Linear Derating Factor  
0.011W/°C  
75mJ  
2
E
Single Pulse Avalanche Energy  
AS  
3
dv/dt  
T , T  
Peak Diode Recovery  
5.5V/ns  
–55 to 150°C  
6.25°C/W  
175°C/W  
Operating and Storage Temperature Range  
Thermal Resistance Junction to Case  
Thermal Resistance Junction-to-Ambient  
J
stg  
R
R
θJC  
θJCA  
Notes  
1) Pulse Test: Pulse Width 300µs, δ ≤ 2%  
2) @ V = 25V , L 112mH , R = 25, Peak I = 1A , Starting T = 25°C  
DD  
G
L
J
3) @ I 1A , di/dt 75A/µs , V BV  
, T 150°C , Suggested R = 24Ω  
J G  
SD  
DD  
DSS  
Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed  
to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use.  
Semelab encourages customers to verify that datasheets are current before placing orders.  
Document Number 5829  
Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612.  
Issue 1  
E-mail: sales@semelab.co.uk  
Website: http://www.semelab.co.uk  

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