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IBMN325404CT3B-75H PDF预览

IBMN325404CT3B-75H

更新时间: 2024-11-21 20:56:43
品牌 Logo 应用领域
国际商业机器公司 - IBM 时钟动态存储器光电二极管内存集成电路
页数 文件大小 规格书
66页 1699K
描述
Synchronous DRAM, 64MX4, 5.4ns, CMOS, PDSO54, 0.400 INCH, PLASTIC, TSOP2-54

IBMN325404CT3B-75H 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:TSOP2
包装说明:TSOP2, TSOP54,.46,32针数:54
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8542.32.00.24风险等级:5.92
访问模式:FOUR BANK PAGE BURST最长访问时间:5.4 ns
其他特性:AUTO/SELF REFRESH最大时钟频率 (fCLK):133 MHz
I/O 类型:COMMON交错的突发长度:1,2,4,8
JESD-30 代码:R-PDSO-G54JESD-609代码:e0
长度:22.22 mm内存密度:268435456 bit
内存集成电路类型:SYNCHRONOUS DRAM内存宽度:4
功能数量:1端口数量:1
端子数量:54字数:67108864 words
字数代码:64000000工作模式:SYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:64MX4输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:TSOP2
封装等效代码:TSOP54,.46,32封装形状:RECTANGULAR
封装形式:SMALL OUTLINE, THIN PROFILE峰值回流温度(摄氏度):NOT SPECIFIED
电源:3.3 V认证状态:Not Qualified
刷新周期:8192座面最大高度:1.2 mm
自我刷新:YES连续突发长度:1,2,4,8
最大待机电流:0.002 A子类别:DRAMs
最大压摆率:0.175 mA最大供电电压 (Vsup):3.6 V
最小供电电压 (Vsup):3 V标称供电电压 (Vsup):3.3 V
表面贴装:YES技术:CMOS
温度等级:COMMERCIAL端子面层:Tin/Lead (Sn/Pb)
端子形式:GULL WING端子节距:0.8 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:10.16 mmBase Number Matches:1

IBMN325404CT3B-75H 数据手册

 浏览型号IBMN325404CT3B-75H的Datasheet PDF文件第2页浏览型号IBMN325404CT3B-75H的Datasheet PDF文件第3页浏览型号IBMN325404CT3B-75H的Datasheet PDF文件第4页浏览型号IBMN325404CT3B-75H的Datasheet PDF文件第5页浏览型号IBMN325404CT3B-75H的Datasheet PDF文件第6页浏览型号IBMN325404CT3B-75H的Datasheet PDF文件第7页 
.
IBMN325164CT3 IBMN325804CT3  
IBMN325404CT3  
Preliminary  
Features  
256Mb Synchronous DRAM - Die Revision B  
• Programmable CAS Latency: 2, 3  
• High Performance:  
3
3
• Programmable Burst Length: 1, 2, 4, 8  
-75H -75D -75A, -260, -360, -10,  
CL=2 CL=3 CL=3 CL=2 CL=3 CL=3  
Units  
• Programmable Wrap: Sequential or Interleave  
Clock  
Frequency  
f
t
t
133 133 133 100 100 100 MHz  
• Multiple Burst Read with Single Write Option  
• Automatic and Controlled Precharge Command  
• Data Mask for Read/Write control (x4, x8)  
• Dual Data Mask for byte control (x16)  
• Auto Refresh (CBR) and Self Refresh  
• Suspend Mode and Power Down Mode  
• Standard Power operation  
CK  
CK  
AC  
Clock Cycle  
7.5  
7.5  
7.5  
10  
10  
10  
7
ns  
ns  
Clock Access  
1
Time  
Clock Access  
t
5.4  
5.4  
5.4  
6
6
9
ns  
2
AC  
Time  
1. Terminated load. See AC Characteristics on page 37.  
2. Unterminated load. See AC Characteristics on page 37.  
3. t = t  
= 2 CKs  
RCD  
RP  
• 8192 refresh cycles/64ms  
• Random Column Address every CK (1-N Rule)  
• Single 3.3V ± 0.3V Power Supply  
LVTTL compatible  
• Single Pulsed RAS Interface  
• Fully Synchronous to Positive Clock Edge  
• Four Banks controlled by BA0/BA1  
(Bank Select)  
• Package: 54-pin 400 mil TSOP-Type II  
Description  
The IBM0325404CT3, IBM0325804CT3, and  
IBM0325164CT3 are four-bank Synchronous  
address data in the conventional RAS/CAS multi-  
plexing style. Thirteen row addresses (A0-A12) and  
two bank select addresses (BA0, BA1) are strobed  
with RAS. Eleven column addresses (A0-A9, A11)  
plus bank select addresses and A10 are strobed  
with CAS. Column address A11 is dropped on the  
x8 device, and column addresses A11 and A9 are  
dropped on the x16 device.  
DRAMs organized as 16Mbit x 4 I/O x 4 Bank, 8Mbit  
x 8 I/O x 4 Bank, and 4Mbit x 16 I/O x 4 Bank,  
respectively. These synchronous devices achieve  
high-speed data transfer rates of up to 133MHz by  
employing a pipeline chip architecture that synchro-  
nizes the output data to a system clock. The chip is  
fabricated with IBM’s advanced 256Mbit single tran-  
sistor CMOS DRAM process technology.  
Prior to any access operation, the CAS latency,  
burst length, and burst sequence must be pro-  
grammed into the device by address inputs A0-A12,  
BA0, BA1 during a mode register set cycle. In addi-  
tion, it is possible to program a multiple burst  
sequence with single write cycle for write through  
cache operation.  
The device is designed to comply with all JEDEC  
standards set for synchronous DRAM products,  
both electrically and mechanically. All of the control,  
address, and data input/output (I/O or DQ) circuits  
are synchronized with the positive edge of an exter-  
nally supplied clock.  
Operating the four memory banks in an interleave  
fashion allows random access operation to occur at  
a higher rate than is possible with standard DRAMs.  
A sequential and gapless data rate of up to 133MHz  
is possible depending on burst length, CAS latency,  
and speed grade of the device. Auto Refresh (CBR)  
and Self Refresh operation are supported.  
RAS, CAS, WE, and CS are pulsed signals which  
are examined at the positive edge of each externally  
applied clock (CK). Internal chip operating modes  
are defined by combinations of these signals and a  
command decoder initiates the necessary timings  
for each operation. A fifteen bit address bus accepts  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
06K0608.F39375A  
10/00  
Page 1 of 66  

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