HSP43220/883
TABLE 3. ELECTRICAL PERFORMANCE SPECIFICATIONS
Devices Guaranteed and 100% Tested
-15 (15MHz)
-25 (25.6MHz)
TEST
CONDITIONS
o
PARAMETER
SYMBOL
NOTES
7, 9
7, 9
7, 9
7, 9
7
TEMP ( C)
-55 ≤ T ≤ 125
MIN
29
29
27
2
MAX
MIN
19
19
17
2
MAX
UNITS
ns
CK_IN Pulse Width Low
CK_IN Pulse Width High
CK_IN Setup to FIR_CK
CK_IN Hold from FIR_CK
Input Capacitance
t
-
-
-
-
CH1L
A
t
-55 ≤ T ≤ 125
ns
CH1H
A
t
-55 ≤ T ≤ 125
-
-
ns
CIS
CIH
A
t
-55 ≤ T ≤ 125
-
-
ns
A
o
C
V
= Open, f = 1MHz,
T
= 25 C
-
12
-
12
pF
IN
OUT
OEZ
CC
A
All measurements are
referenced to device
GND
o
Output Capacitance
C
V
= Open, f = 1MHz,
7
T
= 25 C
-
10
-
10
pF
CC
A
All measurements are
referenced to device
GND
Output Disable Delay
Output Rise Time
Output Fall Time
NOTES:
t
7, 8
7, 8
7, 8
-55 ≤ T ≤ 125
-
-
-
20
8
-
-
-
20
8
ns
ns
ns
A
t
-55 ≤ T ≤ 125
A
OR
t
-55 ≤ T ≤ 125
8
8
OF
A
7. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested. These parameters are characterized
upon initial design and after major process and/or design changes.
8. Loading is as specified in the test load circuit with C = 40pF.
L
9. Applies only when H_BYP = 1 or H_DRATE = 0.
TABLE 4. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
Initial Test
METHOD
100%/5004
100%/5004
100%
SUBGROUPS
-
Interim Test
-
PDA
1
Final Test
100%
2, 3, 8A, 8B, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11
1, 7, 9
Group A
-
Groups C and D
Samples/5005
4