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HCS00MS PDF预览

HCS00MS

更新时间: 2023-12-20 18:46:25
品牌 Logo 应用领域
瑞萨 - RENESAS
页数 文件大小 规格书
8页 358K
描述
Quad 2-Input NAND Gate

HCS00MS 数据手册

 浏览型号HCS00MS的Datasheet PDF文件第2页浏览型号HCS00MS的Datasheet PDF文件第3页浏览型号HCS00MS的Datasheet PDF文件第4页浏览型号HCS00MS的Datasheet PDF文件第6页浏览型号HCS00MS的Datasheet PDF文件第7页浏览型号HCS00MS的Datasheet PDF文件第8页 
HCS00MS  
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS  
OSCILLATOR  
OPEN  
GROUND  
1/2 VCC = 3V 0.5V  
VCC = 6V 0.5V  
50kHz  
25kHz  
STATIC BURN-IN I TEST CONDITIONS (Note 1)  
3, 6, 8, 11  
1, 2, 4, 5, 7, 9, 10, 12,  
13  
-
14  
-
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)  
3, 6, 8, 11  
7
-
1, 2, 4, 5, 9, 10, 12,  
13, 14  
-
-
DYNAMIC BURN-IN I TEST CONNECTIONS (Note 2)  
-
7
3, 6, 8, 11  
14  
1, 2, 4, 5, 9, 10,  
12, 13  
NOTES:  
1. Each pin except VCC and GND will have a resistor of 10K  5% static burn-in.  
2. Each pin except VCC and GND will have a resistor of 1K  5% static burn-in.  
TABLE 9. IRRADIATION TEST CONNECTIONS  
OPEN  
GROUND  
VCC = 5V 0.5V  
1, 2, 4, 5, 9, 10, 12, 13, 14  
3, 6, 8, 11  
7
NOTE: Each pin except VCC and GND will have a resistor of 47K  5%. Group E, Subgroup 2,  
sample size is 4 dice/wafer, 0 failures.  
FN2138 Rev 2.00  
August 1995  
Page 5 of 8  

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