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GAL22LV10 PDF预览

GAL22LV10

更新时间: 2024-11-10 04:19:19
品牌 Logo 应用领域
莱迪思 - LATTICE /
页数 文件大小 规格书
18页 218K
描述
Low Voltage E2CMOS PLD Generic Array Logic⑩

GAL22LV10 数据手册

 浏览型号GAL22LV10的Datasheet PDF文件第2页浏览型号GAL22LV10的Datasheet PDF文件第3页浏览型号GAL22LV10的Datasheet PDF文件第4页浏览型号GAL22LV10的Datasheet PDF文件第5页浏览型号GAL22LV10的Datasheet PDF文件第6页浏览型号GAL22LV10的Datasheet PDF文件第7页 
GAL22LV10  
Low Voltage E2CMOS PLD  
Generic Array Logic™  
FUNCTIONAL BLOCK DIAGRAM  
FEATURES  
• HIGH PERFORMANCE E2CMOS® TECHNOLOGY  
— 4 ns Maximum Propagation Delay  
— Fmax = 250 MHz  
RESET  
I/CLK  
8
— 3 ns Maximum from Clock Input to Data Output  
OLMC  
OLMC  
OLMC  
OLMC  
OLMC  
OLMC  
OLMC  
OLMC  
OLMC  
OLMC  
I/O/Q  
I/O/Q  
— UltraMOS® Advanced CMOS Technology  
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• 3.3V LOW VOLTAGE 22V10 ARCHITECTURE  
— JEDEC-Compatible 3.3V Interface Standard  
— 5V Compatible Inputs  
— I/O Interfaces with Standard 5V TTL Devices  
(GAL22LV10C)  
10  
12  
I/O/Q  
I/O/Q  
• ACTIVE PULL-UPS ON ALL PINS (GAL22LV10D)  
• E2 CELL TECHNOLOGY  
— Reconfigurable Logic  
— Reprogrammable Cells  
— 100% Tested/100% Yields  
— High Speed Electrical Erasure (<100ms)  
— 20 Year Data Retention  
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16  
16  
14  
I/O/Q  
I/O/Q  
• TEN OUTPUT LOGIC MACROCELLS  
— Maximum Flexibility for Complex Logic Designs  
— Programmable Output Polarity  
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I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
• PRELOAD AND POWER-ON RESET OF ALL REGISTERS  
— 100% Functional Testability  
12  
10  
• APPLICATIONS INCLUDE:  
— Glue Logic for 3.3V Systems  
— DMA Control  
— State Machine Control  
— High Speed Graphics Processing  
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— Standard Logic Speed Upgrade  
8
• ELECTRONIC SIGNATURE FOR IDENTIFICATION  
DESCRIPTION  
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PRESET  
The GAL22LV10D, at 4 ns maximum propagation delay time,  
provides the highest speed performance available in the PLD  
market. The GAL22LV10C can interface with both 3.3V and 5V  
signal levels. The GAL22LV10 is manufactured using Lattice  
Semiconductor's advanced 3.3V E2CMOS process, which com-  
bines CMOS with Electrically Erasable (E2) floating gate technol-  
ogy. High speed erase times (<100ms) allow the devices to be  
reprogrammed quickly and efficiently.  
PIN CONFIGURATION  
PLCC  
4
2
28  
26  
5
I
25  
I/O/Q  
I/O/Q  
I/O/Q  
The generic architecture provides maximum design flexibility by  
allowing the Output Logic Macrocell (OLMC) to be configured by  
the user.  
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23  
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GAL22LV10  
Top View  
NC  
NC  
Unique test circuitry and reprogrammable cells allow complete  
AC, DC, and functional testing during manufacture. As a result,  
Lattice Semiconductor delivers 100% field programmability and  
functionality of all GAL products. In addition, 100 erase/write  
cycles and data retention in excess of 20 years are specified.  
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I/O/Q  
I/O/Q  
I/O/Q  
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Copyright © 1997 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject  
to change without notice.  
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.  
Tel. (503) 681-0118; 1-888-ISP-PLDS; FAX (503) 681-3037; http://www.latticesemi.com  
July 1997  
22lv10_03  
1

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