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GAL22LV10C-15J PDF预览

GAL22LV10C-15J

更新时间: 2024-11-07 23:53:35
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其他 - ETC /
页数 文件大小 规格书
18页 295K
描述
IC-SM-CMOS PLD

GAL22LV10C-15J 数据手册

 浏览型号GAL22LV10C-15J的Datasheet PDF文件第2页浏览型号GAL22LV10C-15J的Datasheet PDF文件第3页浏览型号GAL22LV10C-15J的Datasheet PDF文件第4页浏览型号GAL22LV10C-15J的Datasheet PDF文件第5页浏览型号GAL22LV10C-15J的Datasheet PDF文件第6页浏览型号GAL22LV10C-15J的Datasheet PDF文件第7页 
GAL22LV10  
Low Voltage E2CMOS PLD  
Generic Array Logic™  
Features  
Functional Block Diagram  
HIGH PERFORMANCE E2CMOS® TECHNOLOGY  
4 ns Maximum Propagation Delay  
Fmax = 250 MHz  
RESET  
I/CLK  
8
3 ns Maximum from Clock Input to Data Output  
OLMC  
OLMC  
OLMC  
OLMC  
OLMC  
OLMC  
OLMC  
OLMC  
OLMC  
OLMC  
I/O/Q  
I/O/Q  
UltraMOS® Advanced CMOS Technology  
I
I
I
I
I
I
3.3V LOW VOLTAGE 22V10 ARCHITECTURE  
JEDEC-Compatible 3.3V Interface Standard  
5V Compatible Inputs  
I/O Interfaces with Standard 5V TTL Devices  
(GAL22LV10C)  
10  
12  
I/O/Q  
I/O/Q  
ACTIVE PULL-UPS ON ALL PINS (GAL22LV10D)  
E2 CELL TECHNOLOGY  
Reconfigurable Logic  
Reprogrammable Cells  
100% Tested/100% Yields  
High Speed Electrical Erasure (<100ms)  
20 Year Data Retention  
14  
16  
16  
14  
I/O/Q  
I/O/Q  
TEN OUTPUT LOGIC MACROCELLS  
Maximum Flexibility for Complex Logic Designs  
Programmable Output Polarity  
I
I
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
PRELOAD AND POWER-ON RESET OF ALL REGISTERS  
100% Functional Testability  
12  
10  
APPLICATIONS INCLUDE:  
Glue Logic for 3.3V Systems  
DMA Control  
State Machine Control  
High Speed Graphics Processing  
Standard Logic Speed Upgrade  
I
I
I
8
ELECTRONIC SIGNATURE FOR IDENTIFICATION  
PRESET  
Description  
Pin Configuration  
PLCC  
The GAL22LV10D, at 4 ns maximum propagation delay time, pro-  
vides the highest speed performance available in the PLD market.  
The GAL22LV10C can interface with both 3.3V and 5V signal levels.  
The GAL22LV10 is manufactured using Lattice Semiconductor's  
advanced 3.3V E2CMOS process, which combines CMOS with  
Electrically Erasable (E2) floating gate technology. High speed erase  
times (<100ms) allow the devices to be reprogrammed quickly and  
efficiently.  
4
2
28  
26  
5
I
25  
I/O/Q  
I/O/Q  
I/O/Q  
I
I
7
9
23  
21  
19  
The generic architecture provides maximum design flexibility by  
allowing the Output Logic Macrocell (OLMC) to be configured by  
the user.  
GAL22LV10  
Top View  
NC  
NC  
I
I
I
I/O/Q  
I/O/Q  
I/O/Q  
Unique test circuitry and reprogrammable cells allow completeAC,  
DC, and functional testing during manufacture. As a result, Lattice  
Semiconductor delivers 100% field programmability and function-  
ality of all GAL products. In addition, 100 erase/write cycles and  
data retention in excess of 20 years are specified.  
11  
12  
14  
16  
18  
Copyright © 1997 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject  
to change without notice.  
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.  
Tel. (503) 681-0118; 1-888-ISP-PLDS; FAX (503) 681-3037; http://www.latticesemi.com  
July 1997  
22lv10_03  
1

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