September 2006
®
QFET
FQPF12N60CT
600V N-Channel MOSFET
Features
Description
•
•
•
•
•
•
12A, 600V, RDS(on) = 0.65Ω @VGS = 10 V
Low gate charge ( typical 48 nC)
Low Crss ( typical 21 pF)
Fast switching
100% avalanche tested
Improved dv/dt capability
These N-Channel enhancement mode power field effect
transistors are produced using Fairchild’s proprietary, planar
stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the avalanche
and commutation mode. These devices are well suited for high
efficient switched mode power supplies, active power factor
correction, electronic lamp ballast based on half bridge
topology.
D
G
TO-220F Potted
FQPF Series
G D S
S
Absolute Maximum Ratings
Symbol
Parameter
FQPF12N60CT
Units
V
VDSS
ID
Drain-Source Voltage
600
12*
Drain Current
- Continuous (TC = 25°C)
- Continuous (TC = 100°C)
- Pulsed
A
7.4*
A
(Note 1)
IDM
Drain Current
48*
A
VGSS
EAS
IAR
Gate-Source Voltage
± 30
870
V
(Note 2)
(Note 1)
(Note 1)
(Note 3)
Single Pulsed Avalanche Energy
Avalanche Current
mJ
A
12
EAR
dv/dt
PD
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Power Dissipation (TC = 25°C)
5.1
mJ
V/ns
W
4.5
51
- Derate above 25°C
0.41
-55 to +150
W/°C
°C
TJ, TSTG
TL
Operating and Storage Temperature Range
Maximum lead temperature for soldering purposes,
1/8" from case for 5 seconds
300
°C
* Drain current limited by maximum junction temperature
Thermal Characteristics
Symbol
Parameter
FQPF12N60CT
Units
°C/W
RθJC
RθJA
Thermal Resistance, Junction-to-Case
2.43
62.5
Thermal Resistance, Junction-to-Ambient
°C/W
©2006 Fairchild Semiconductor Corporation
FQPF12N60CT Rev. A
1
www.fairchildsemi.com