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EPF6016AFC256-3 PDF预览

EPF6016AFC256-3

更新时间: 2024-02-04 22:20:50
品牌 Logo 应用领域
阿尔特拉 - ALTERA 时钟LTE输入元件可编程逻辑
页数 文件大小 规格书
52页 375K
描述
Loadable PLD, CMOS, PBGA256, FINE LINE, BGA-256

EPF6016AFC256-3 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Transferred零件包装代码:BGA
包装说明:BGA,针数:256
Reach Compliance Code:compliantHTS代码:8542.39.00.01
风险等级:5.14最大时钟频率:133 MHz
JESD-30 代码:S-PBGA-B256JESD-609代码:e1
长度:17 mm专用输入次数:4
I/O 线路数量:171端子数量:256
最高工作温度:85 °C最低工作温度:
组织:4 DEDICATED INPUTS, 171 I/O输出函数:MACROCELL
封装主体材料:PLASTIC/EPOXY封装代码:BGA
封装形状:SQUARE封装形式:GRID ARRAY
峰值回流温度(摄氏度):260可编程逻辑类型:LOADABLE PLD
认证状态:Not Qualified座面最大高度:2.1 mm
最大供电电压:3.6 V最小供电电压:3 V
标称供电电压:3.3 V表面贴装:YES
温度等级:OTHER端子面层:TIN SILVER COPPER
端子形式:BALL端子节距:1 mm
端子位置:BOTTOM处于峰值回流温度下的最长时间:40
宽度:17 mmBase Number Matches:1

EPF6016AFC256-3 数据手册

 浏览型号EPF6016AFC256-3的Datasheet PDF文件第2页浏览型号EPF6016AFC256-3的Datasheet PDF文件第3页浏览型号EPF6016AFC256-3的Datasheet PDF文件第4页浏览型号EPF6016AFC256-3的Datasheet PDF文件第6页浏览型号EPF6016AFC256-3的Datasheet PDF文件第7页浏览型号EPF6016AFC256-3的Datasheet PDF文件第8页 
FLEX 6000 Programmable Logic Device Family Data Sheet  
The FLEX 6000 OptiFLEX architecture consists of logic elements (LEs).  
Each LE includes a 4-input look-up table (LUT), which can implement any  
4-input function, a register, and dedicated paths for carry and cascade  
chain functions. Because each LE contains a register, a design can be easily  
pipelined without consuming more LEs. The specified gate count for  
FLEX 6000 devices includes all LUTs and registers.  
Functional  
Description  
LEs are combined into groups called logic array blocks (LABs); each LAB  
contains 10 LEs. The Altera software automatically places related LEs into  
the same LAB, minimizing the number of required interconnects. Each  
LAB can implement a medium-sized block of logic, such as a counter or  
multiplexer.  
Signal interconnections within FLEX 6000 devices—and to and from  
device pins—are provided via the routing structure of the FastTrack  
Interconnect. The routing structure is a series of fast, continuous row and  
column channels that run the entire length and width of the device. Any  
LE or pin can feed or be fed by any other LE or pin via the FastTrack  
Interconnect. See “FastTrack Interconnect” on page 17 of this data sheet  
for more information.  
Each I/O pin is fed by an I/O element (IOE) located at the end of each row  
and column of the FastTrack Interconnect. Each IOE contains a  
bidirectional I/O buffer. Each IOE is placed next to an LAB, where it can  
be driven by the local interconnect of that LAB. This feature allows fast  
clock-to-output times of less than 8 ns when a pin is driven by any of the  
10 LEs in the adjacent LAB. Also, any LE can drive any pin via the row and  
column interconnect. I/O pins can drive the LE registers via the row and  
column interconnect, providing setup times as low as 2 ns and hold times  
of 0 ns. IOEs provide a variety of features, such as JTAG BST support,  
slew-rate control, and tri-state buffers.  
Figure 1 shows a block diagram of the FLEX 6000 OptiFLEX architecture.  
Each group of ten LEs is combined into an LAB, and the LABs are  
arranged into rows and columns. The LABs are interconnected by the  
FastTrack Interconnect. IOEs are located at the end of each FastTrack  
Interconnect row and column.  
Altera Corporation  
5

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