CY7C144AV
CY7C006AV
AC Test Loads and Waveforms
Figure 3. AC Test Loads and Waveforms
3.3 V
3.3 V
R
TH
= 250
OUTPUT
30 pF
R1 = 590
R1 = 590
OUTPUT
C
=
OUTPUT
C = 5 pF
= 1.4 V
TH
C = 30 pF
R2 = 435
V
R2 = 435
(a) Normal Load (Load 1)
(b) Thévenin Equivalent (Load 1)
(c) Three-State Delay(Load 2)
ALL INPUTPULSES
(Used for tLZ, tHZ, tHZWE & tLZWE
3.0V
GND
including scope and jig)
90%
90%
10%
3 ns
10%
3 ns
Data Retention Mode
Timing
The CY7C144AV and CY7C006AV are designed with battery
backup in mind. Data retention voltage and supply current are
guaranteed over temperature. The following rules ensure data
retention:
Figure 4. Timing
Data Retention Mode
V
CC
3.0 V
1. Chip enable (CE) must be held HIGH during data retention,
within VCC to VCC – 0.2 V.
3.0 V
V
CC
2.0 V
t
RC
2. CE must be kept between VCC – 0.2 V and 70% of VCC during
the power-up and power-down transitions.
V
CC
to V – 0.2 V
CC
V
IH
CE
3. The RAM can begin operation > tRC after VCC reaches the
minimum operating voltage (3.0 Volts).
Parameter
Test Conditions [8]
@ VCCDR = 2 V
Max
Unit
ICCDR1
50
A
Note
8. CE = V , V = GND to V , T = 25 °C. This parameter is guaranteed but not tested.
CC
IN
CC
A
Document Number: 38-06051 Rev. *H
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