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CY7C1292DV18-200BZXI PDF预览

CY7C1292DV18-200BZXI

更新时间: 2024-12-01 02:56:39
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 存储内存集成电路静态存储器时钟
页数 文件大小 规格书
23页 990K
描述
9-Mbit QDR- II⑩ SRAM 2-Word Burst Architecture

CY7C1292DV18-200BZXI 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Obsolete零件包装代码:BGA
包装说明:LBGA, BGA165,11X15,40针数:165
Reach Compliance Code:compliantECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.8
最长访问时间:0.45 ns其他特性:PIPELINED ARCHITECTURE
最大时钟频率 (fCLK):200 MHzI/O 类型:SEPARATE
JESD-30 代码:R-PBGA-B165JESD-609代码:e1
长度:15 mm内存密度:9437184 bit
内存集成电路类型:QDR SRAM内存宽度:18
湿度敏感等级:3功能数量:1
端子数量:165字数:524288 words
字数代码:512000工作模式:SYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:512KX18输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:LBGA
封装等效代码:BGA165,11X15,40封装形状:RECTANGULAR
封装形式:GRID ARRAY, LOW PROFILE并行/串行:PARALLEL
峰值回流温度(摄氏度):260电源:1.5/1.8,1.8 V
认证状态:Not Qualified座面最大高度:1.4 mm
最大待机电流:0.26 A最小待机电流:1.7 V
子类别:SRAMs最大压摆率:0.55 mA
最大供电电压 (Vsup):1.9 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Tin/Silver/Copper (Sn/Ag/Cu)端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:20宽度:13 mm
Base Number Matches:1

CY7C1292DV18-200BZXI 数据手册

 浏览型号CY7C1292DV18-200BZXI的Datasheet PDF文件第2页浏览型号CY7C1292DV18-200BZXI的Datasheet PDF文件第3页浏览型号CY7C1292DV18-200BZXI的Datasheet PDF文件第4页浏览型号CY7C1292DV18-200BZXI的Datasheet PDF文件第5页浏览型号CY7C1292DV18-200BZXI的Datasheet PDF文件第6页浏览型号CY7C1292DV18-200BZXI的Datasheet PDF文件第7页 
CY7C1292DV18  
CY7C1294DV18  
9-Mbit QDR- II™ SRAM 2-Word  
Burst Architecture  
Features  
Functional Description  
• Separate Independent Read and Write data ports  
The CY7C1292DV18 and CY7C1294DV18 are 1.8V  
Synchronous Pipelined SRAMs, equipped with QDR™-II  
architecture. QDR-II architecture consists of two separate  
ports to access the memory array. The Read port has  
dedicated Data Outputs to support Read operations and the  
Write Port has dedicated Data Inputs to support Write opera-  
tions. QDR-II architecture has separate data inputs and data  
outputs to completely eliminate the need to “turn-around” the  
data bus required with common I/O devices. Access to each  
port is accomplished through a common address bus. The  
Read address is latched on the rising edge of the K clock and  
the Write address is latched on the rising edge of the K clock.  
Accesses to the QDR-II Read and Write ports are completely  
independent of one another. In order to maximize data  
throughput, both Read and Write ports are equipped with  
Double Data Rate (DDR) interfaces. Each address location is  
associated with two 18-bit words (CY7C1292DV18) or 36-bit  
words (CY7C1294DV18) that burst sequentially into or out of  
the device. Since data can be transferred into and out of the  
device on every rising edge of both input clocks (K and K and  
C and C), memory bandwidth is maximized while simplifying  
system design by eliminating bus “turn-arounds.”  
— Supports concurrent transactions  
• 250-MHz clock for high bandwidth  
• 2-Word Burst on all accesses  
• Double Data Rate (DDR) interfaces on both Read and  
Write ports (data transferred at 500 MHz) @ 250 MHz  
• Two input clocks (K and K) for precise DDR timing  
— SRAM uses rising edges only  
• Two input clocks for output data (C and C) to minimize  
clock-skew and flight-time mismatches  
• Echo clocks (CQ and CQ) simplify data capture in  
high-speed systems  
• Single multiplexed address input bus latches address  
inputs for both Read and Write ports  
• Separate Port Selects for depth expansion  
• Synchronous internally self-timed writes  
• Available in x 18 and x 36 configurations  
• Full data coherency, providing most current data  
Depth expansion is accomplished with Port Selects for each  
port. Port selects allow each port to operate independently.  
• Core VDD = 1.8V (±0.1V); I/O VDDQ = 1.4V to VDD  
• Available in 165-ball FBGA package (13 x 15 x 1.4 mm)  
• Offered in both lead-free and non-lead free packages  
All synchronous inputs pass through input registers controlled  
by the K or K input clocks. All data outputs pass through output  
registers controlled by the C or C (or K or K in a single clock  
domain) input clocks. Writes are conducted with on-chip  
synchronous self-timed write circuitry.  
• Variable drive HSTL output buffers  
• JTAG 1149.1 compatible test access port  
• Delay Lock Loop (DLL) for accurate data placement  
Configurations  
CY7C1292DV18 – 512K x 18  
CY7C1294DV18 – 256K x 36  
Selection Guide  
250 MHz  
200 MHz  
200  
167 MHz  
167  
Unit  
MHz  
mA  
Maximum Operating Frequency  
Maximum Operating Current  
250  
600  
550  
500  
Cypress Semiconductor Corporation  
Document #: 001-00350 Rev. *A  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised July 20, 2006  
[+] Feedback  

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