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5962-9458501HNX PDF预览

5962-9458501HNX

更新时间: 2024-10-29 07:44:51
品牌 Logo 应用领域
美高森美 - MICROSEMI 可编程只读存储器电动程控只读存储器电可擦编程只读存储器
页数 文件大小 规格书
15页 300K
描述
EEPROM Module, 128KX32, 300ns, Parallel, CMOS, CQMA68, CERAMIC, QFP-68

5962-9458501HNX 数据手册

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WE128K32-XXX  
READ  
The WE128K32-XXX stores data at the memory location  
determined by the address pins. When CS and OE are low and  
WE is high, this data is present on the outputs. When CS and  
OE are high, the outputs are in a high impedance state. This  
two line control prevents bus contention.  
AC READ CHARACTERISTICS  
(VCC = 5.0V, VSS = 0V, TA = -55°C to +125°C)  
Read Cycle Parameter  
Symbol  
-120  
-140  
-150  
-200  
-250  
Min Max  
-300  
Min Max  
Unit  
Min  
Max  
Min  
Max  
Min  
Max  
Min  
Max  
Read Cycle Time  
tRC  
tACC  
tACS  
tOH  
tOE  
120  
140  
150  
200  
250  
250  
250  
0
300  
300  
300  
0
ns  
ns  
ns  
ns  
ns  
ns  
Address Access Time  
120  
120  
140  
140  
150  
150  
200  
200  
Chip Select Access Time  
Output Hold from Add. Change, OE or CS  
Output Enable to Output Valid  
Chip Select or OE to High Z Output  
0
0
0
0
0
0
0
0
50  
70  
55  
70  
55  
70  
55  
70  
0
85  
70  
0
85  
70  
tDF  
FIG. 7  
READ WAVEFORMS  
t
RC  
ADDRESS VALID  
ADDRESS  
CS1-4  
t
ACS  
t
OE  
OE  
t
DF  
t
ACC  
t
OH  
NOTES:  
HIGH Z  
OUTPUT  
VALID  
OE may be delayed up to tACS - tOE after the  
falling edge of CS without impact on tOE or by  
tACC - tOE after an address change without  
impact on tACC.  
OUTPUT  
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com  
6

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