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2N7000 PDF预览

2N7000

更新时间: 2024-11-30 05:56:07
品牌 Logo 应用领域
美国国家半导体 - NSC 晶体晶体管开关
页数 文件大小 规格书
10页 209K
描述
N-Channel Enhancement Mode Field Effect Transistor

2N7000 数据手册

 浏览型号2N7000的Datasheet PDF文件第2页浏览型号2N7000的Datasheet PDF文件第3页浏览型号2N7000的Datasheet PDF文件第4页浏览型号2N7000的Datasheet PDF文件第5页浏览型号2N7000的Datasheet PDF文件第6页浏览型号2N7000的Datasheet PDF文件第7页 
March 1993  
2N7000/2N7002/NDF7000A/NDS7002A  
N-Channel Enhancement Mode Field Effect Transistor  
General Description  
Features  
Y
Efficient high density cell design approaching  
2
(3 million/in )  
These n-channel enhancement mode field effect transistors  
are produced using National’s very high cell density third  
generation DMOS technology. These products have been  
designed to minimize on-state resistance provide rugged  
and reliable performance and fast switching. They can be  
used, with a minimum of effort, in most applications requir-  
ing up to 400 mA DC and can deliver pulsed currents up to  
2A. This product is particularly suited to low voltage, low  
current applications, such as small servo motor controls,  
power MOSFET gate drivers, and other switching applica-  
tions.  
Y
Voltage controlled small signal switch  
Y
Rugged  
Y
High saturation current  
Y
Low R  
(ON)  
DS  
TL/G/11378–2  
TL/G/11378–1  
TO-92  
7000 Series  
TO-236 AB  
(SOT-23)  
7002 Series  
TL/G/11378–3  
Absolute Maximum Ratings  
Symbol  
Parameter  
Drain-Source Voltage  
2N7000  
2N7002  
NDF7000A  
NDS7002A  
Units  
V
V
60  
60  
DSS  
DGR  
GSS  
s
V
V
Drain-Gate Voltage (R  
Gate-Source Voltage  
1 MX)  
V
GS  
g
40  
400  
V
I
Drain CurrentÐContinuous  
200  
500  
400  
3.2  
115  
800  
200  
1.6  
280  
1500  
300  
2.4  
mA  
mA  
mW  
D
ÐPulsed  
2000  
625  
5
@
e
25 C  
P
D
Total Power Dissipation  
T
§
A
Derating above 25 C  
§
mW/ C  
§
b
b
65 to 150  
T , T  
J STG  
Operating and Storage Temperature Range  
55 to 150  
C
§
T
L
Maximum Lead Temperature for Soldering  
300  
C
§
Purposes, (/16* from Case for 10 Seconds  
C
1995 National Semiconductor Corporation  
TL/G/11378  
RRD-B30M115/Printed in U. S. A.  

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