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W28C256FHT PDF预览

W28C256FHT

更新时间: 2024-11-22 19:44:39
品牌 Logo 应用领域
温彻斯特电子 - WINCHESTER 可编程只读存储器电动程控只读存储器电可擦编程只读存储器内存集成电路
页数 文件大小 规格书
12页 120K
描述
EEPROM, 32KX8, Parallel, CMOS, FP-32

W28C256FHT 技术参数

生命周期:Obsolete零件包装代码:DFP
包装说明:DFP,针数:32
Reach Compliance Code:unknownECCN代码:3A001.A.2.C
HTS代码:8542.32.00.51风险等级:5.79
JESD-30 代码:R-XDFP-F32长度:20.828 mm
内存密度:262144 bit内存集成电路类型:EEPROM
内存宽度:8功能数量:1
端子数量:32字数:32768 words
字数代码:32000工作模式:SYNCHRONOUS
最高工作温度:125 °C最低工作温度:-55 °C
组织:32KX8封装主体材料:UNSPECIFIED
封装代码:DFP封装形状:RECTANGULAR
封装形式:FLATPACK并行/串行:PARALLEL
编程电压:5 V认证状态:Not Qualified
座面最大高度:3.048 mm最大供电电压 (Vsup):5.25 V
最小供电电压 (Vsup):4.75 V标称供电电压 (Vsup):5 V
表面贴装:YES技术:CMOS
温度等级:MILITARY端子形式:FLAT
端子节距:1.27 mm端子位置:DUAL
总剂量:300k Rad(Si) V宽度:13.716 mm
最长写入周期时间 (tWC):10 msBase Number Matches:1

W28C256FHT 数据手册

 浏览型号W28C256FHT的Datasheet PDF文件第2页浏览型号W28C256FHT的Datasheet PDF文件第3页浏览型号W28C256FHT的Datasheet PDF文件第4页浏览型号W28C256FHT的Datasheet PDF文件第5页浏览型号W28C256FHT的Datasheet PDF文件第6页浏览型号W28C256FHT的Datasheet PDF文件第7页 
W28C256  
Radiation Hardened 32K x 8 CMOS EEPROM  
Northrop Grumman Corporation  
ECN 2005178  
May 2005  
Rev. F  
Features  
1.25 Micrometer Radiation Hardened CMOS on Epi  
Total Dose up to 300 Krad (Si)  
Transient Logic Upset >5E7 Rad(Si)/sec  
Memory Data Loss >1E12 Rad(Si)/sec  
VW  
A14  
A12  
A7  
A6  
A5  
A4  
A3  
A2  
A1  
A0  
D0  
D1  
D2  
VSS  
CLK  
1
2
3
4
5
6
7
8
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
PE  
VDD  
WEB  
A13  
A8  
A9  
Single Event Upsets  
A11  
OEB  
A10  
CEB  
D7  
D6  
D5  
D4  
D3  
SEU During READ  
LETth = 60 MeV/mg/cm2  
32 FP  
9
SEU in Address/Data Latches,  
10  
11  
12  
13  
14  
15  
16  
LETth = 35 MeV/mg/cm2  
Permanent SEU damage (During Write Only),  
Atomic Number Kr  
No Latchup  
Compatible with commercial EEPROMs  
JEDEC pin compatible in center 28 pins  
RSTB  
PINOUT  
(Top View)  
Full military operating temperature range, screened to  
specific test methods for commercial, Class B, or modified  
Hi Rel.  
Supports these commercial features:  
Self-Timed Programming  
Combined Erase/Write  
Auto Program Start  
+5V only read operation  
Asynchronous Addressing  
64 Word Page  
Data Polling  
Introduction  
The W28C256 is a 32K x 8 radiation hardened EEPROM  
designed by Sandia National Laboratories, Albuquerque  
NM, and manufactured by the Northrop Grumman  
Advanced Technology Center, Baltimore MD, using  
nonvolatile memory technology transferred from Sandia. It  
is built using a mature dual well CMOS process using N on  
N+ epitaxial silicon and a two layer interconnect system.  
Caution: These devices are sensitive to electrostatic discharge. Users should follow proper I.C. handling procedures.  
1

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