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TS3A44159-DIE_15 PDF预览

TS3A44159-DIE_15

更新时间: 2024-09-16 01:10:35
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德州仪器 - TI 光电二极管
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描述
TS3A44159-DIE Quad SPDT Analog Switch Quad-Channel 2:1 Multiplexer/Demultiplexer With Two Controls

TS3A44159-DIE_15 数据手册

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TS3A44159-DIE  
SCDS354 FEBRUARY 2014  
TS3A44159-DIE Quad SPDT Analog Switch Quad-Channel 2:1 Multiplexer/Demultiplexer  
With Two Controls  
1 Features  
3 Description  
The TS3A44159-DIE is a quad single-pole double-  
throw (SPDT) analog switch with two control inputs.  
This device is also known as a dual double-pole  
double-throw (DPDT) configuration. It offers low ON-  
state resistance and excellent ON-state resistance  
matching with the break-before-make feature, to  
prevent signal distortion during the transferring of a  
signal from one channel to another. The device has  
an excellent total harmonic distortion (THD)  
performance and consumes very low power. These  
features make this device suitable for portable audio  
applications.  
1
Specified Break-Before-Make Switching  
Low ON-State Resistance  
Low Charge Injection  
Excellent ON-State Resistance Matching  
Low Total Harmonic Distortion (THD)  
2 Applications  
Cell Phones  
PDAs  
Portable Instrumentation  
Audio and Video Signal Routing  
Low-Voltage Data-Acquisition Systems  
Communication Circuits  
Modems  
Hard Drives  
Computer Peripherals  
Wireless Terminals and Peripherals  
Ordering Information(1)  
PACKAGE  
PRODUCT  
PACKAGE  
ORDERABLE PART NUMBER  
PACKAGE QUANTITY  
DESIGNATOR  
TS3A44159TD1  
TS3A44159TD2  
221  
10  
TS3A44159  
TD  
Bare die in waffle pack(2)  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality  
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room  
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not  
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.  
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. PRODUCTION DATA.  

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