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TPCS8302 PDF预览

TPCS8302

更新时间: 2024-11-24 03:26:47
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体电池小信号场效应晶体管开关光电二极管电脑便携式便携式设备PC
页数 文件大小 规格书
7页 194K
描述
Lithium Ion Battery Applications Notebook PC Applications Portable Equipment Applications

TPCS8302 技术参数

是否无铅:含铅是否Rohs认证:不符合
生命周期:End Of Life包装说明:LEAD FREE, 2-3R1E, 8 PIN
针数:8Reach Compliance Code:unknown
ECCN代码:EAR99风险等级:5.77
Is Samacsys:N配置:SEPARATE, 2 ELEMENTS WITH BUILT-IN DIODE
最小漏源击穿电压:20 V最大漏极电流 (Abs) (ID):5 A
最大漏极电流 (ID):5 A最大漏源导通电阻:0.095 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJESD-30 代码:R-PDSO-G8
JESD-609代码:e4元件数量:2
端子数量:8工作模式:ENHANCEMENT MODE
最高工作温度:150 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
峰值回流温度(摄氏度):NOT SPECIFIED极性/信道类型:P-CHANNEL
最大功率耗散 (Abs):0.75 W认证状态:Not Qualified
子类别:Other Transistors表面贴装:YES
端子面层:NICKEL PALLADIUM GOLD端子形式:GULL WING
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

TPCS8302 数据手册

 浏览型号TPCS8302的Datasheet PDF文件第2页浏览型号TPCS8302的Datasheet PDF文件第3页浏览型号TPCS8302的Datasheet PDF文件第4页浏览型号TPCS8302的Datasheet PDF文件第5页浏览型号TPCS8302的Datasheet PDF文件第6页浏览型号TPCS8302的Datasheet PDF文件第7页 
TPCS8302  
TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (U-MOSIII)  
TPCS8302  
Lithium Ion Battery Applications  
Unit: mm  
Notebook PC Applications  
Portable Equipment Applications  
Small footprint due to small and thin package  
Low drain-source ON resistance: R = 22 m(typ.)  
DS (ON)  
High forward transfer admittance: |Y | = 12 S (typ.)  
fs  
Low leakage current: I  
= 10 μA (max) (V  
= 20 V)  
DSS  
DS  
Enhancement mode: V = 0.5~1.2 V (V  
= 10 V, I = 200 μA)  
D
th  
DS  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
20  
20  
±12  
5  
V
V
V
DSS  
Drain-gate voltage (R  
Gate-source voltage  
= 20 kΩ)  
V
GS  
DGR  
V
GSS  
JEDEC  
JEITA  
DC  
(Note 1)  
(Note 1)  
I
D
Drain current  
A
Pulse  
I
20  
DP  
TOSHIBA  
2-3R1E  
Single-device  
operation (Note 3a)  
P
P
P
P
1.1  
0.75  
0.6  
D (1)  
Drain power  
dissipation  
(t = 10 s)  
Weight: 0.035 g (typ.)  
W
Single-device value  
at dual operation  
(Note 3b)  
(Note 2a)  
D (2)  
D (1)  
D (2)  
Single-device  
operation (Note 3a)  
Circuit Configuration  
Drain power  
dissipation  
(t = 10 s)  
W
8
7
6
5
Single-device value  
at dual operation  
(Note 3b)  
0.35  
(Note 2b)  
Single pulse avalanche energy  
(Note 4)  
E
32.5  
mJ  
A
AS  
Avalanche current  
I
5  
AR  
Repetitive avalanche energy  
Single-device value at dual operation  
(Note 2a, 3b, 5)  
E
0.075  
mJ  
AR  
Channel temperature  
T
150  
°C  
°C  
ch  
1
2
3
4
Storage temperature range  
T
55~150  
stg  
Note: (Note 1), (Note 2), (Note 3), (Note 4) and (Note 5): See next page.  
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e.  
operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate  
reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and  
Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).  
This transistor is an electrostatic-sensitive device. Please handle with caution.  
1
2006-11-16  

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