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TC7SH126FU(TE85L) PDF预览

TC7SH126FU(TE85L)

更新时间: 2024-11-05 21:03:59
品牌 Logo 应用领域
东芝 - TOSHIBA 驱动光电二极管逻辑集成电路
页数 文件大小 规格书
6页 167K
描述
IC,BUFFER/DRIVER,SINGLE,1-BIT,CMOS,TSSOP,5PIN,PLASTIC

TC7SH126FU(TE85L) 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:TSSOP, TSSOP5/6,.08Reach Compliance Code:unknown
风险等级:5.92控制类型:ENABLE HIGH
JESD-30 代码:R-PDSO-G5负载电容(CL):50 pF
逻辑集成电路类型:BUS DRIVER最大I(ol):0.004 A
位数:1功能数量:1
端子数量:5最高工作温度:85 °C
最低工作温度:-40 °C输出特性:3-STATE
输出极性:TRUE封装主体材料:PLASTIC/EPOXY
封装代码:TSSOP封装等效代码:TSSOP5/6,.08
封装形状:RECTANGULAR封装形式:SMALL OUTLINE, THIN PROFILE, SHRINK PITCH
包装方法:TAPE AND REEL电源:2/5.5 V
Prop。Delay @ Nom-Sup:13 ns认证状态:Not Qualified
子类别:Bus Driver/Transceivers表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子形式:GULL WING端子节距:0.635 mm
端子位置:DUALBase Number Matches:1

TC7SH126FU(TE85L) 数据手册

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TC7SH126F/FU  
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic  
TC7SH126F, TC7SH126FU  
Bus Buffer with 3-STATE Output  
TC7SH126F  
Features  
High speed: t = 3.8 ns (typ.) at V  
= 5V, C = 15pF  
pd  
CC L  
Low power dissipation: I  
= 2μA (max) at Ta = 25°C  
CC  
High noise immunity: V  
5.5 V tolerant input  
= V  
= 28% V  
(min)  
NIH  
NIL  
CC  
Wide operating voltage range: V  
= 2 to 5.5 V  
CC  
TC7SH126FU  
(USV)  
Weight  
SSOP5-P-0.95  
: 0.016 g (typ.)  
SSOP5-P-0.65A : 0.006 g (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
Marking  
Product name  
Characteristics  
Supply voltage  
Symbol  
Rating  
Unit  
V
0.5 to 7.0  
0.5 to 7.0  
V
V
CC  
H C  
DC input voltage  
V
IN  
DC output voltage  
Input diode current  
Output diode current  
DC output current  
V
0.5 to V  
+ 0.5  
V
OUT  
CC  
I
20  
mA  
mA  
mA  
mA  
mW  
°C  
IK  
Pin Assignment (top view)  
I
±20 (Note 1)  
OK  
I
±25  
±50  
200  
OUT  
G
1
5
V
CC  
DC V /ground current  
CC  
I
CC  
Power dissipation  
P
D
IN A  
GND  
2
Storage temperature  
Lead temperature (10 s)  
T
65 to 150  
260  
stg  
T
L
°C  
3
4
OUT Y  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if  
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings and the operating ranges.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/”Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1:V  
< GND, V > V  
OUT CC  
OUT  
1
2009-09-21  

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