TC7S04F/FU
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC7S04F,TC7S04FU
Inverter
The TC7S04 is a high speed C2MOS Inverter fabricated with
silicon gate C2MOS technology.
TC7S04F
It achieves high speed operation similar to equivalent LSTTL
while maintaining the C2MOS low power dissipation.
The internal circuit is composed of 3 stages including buffer
output, which enables high noise immunity and stable output.
The input is equipped with protection circuits against static
discharge or transient excess voltage.
Output currents are 1/2 compared to TC74HC series models.
TC7S04FU
Features
•
•
•
•
•
•
•
High speed: t = 7 ns (typ.) at V
= 5 V
pd
CC
Low power dissipation: I
= 1 μA (max) at Ta = 25°C
CC
High noise immunity: V
= V
= 28% V
(min)
NIH
NIL
CC
Output drive capability: 5 LSTTL loads
Symmetrical output impedance: |I | = I
= 2 mA (min)
OL
OH
∼
−
Balanced propagation delays: t
t
pHL
pLH
Wide operating voltage range: V
(opr) = 2 to 6 V
CC
Weight
SSOP5-P-0.95: 0.016 g (typ.)
SSOP5-P-0.65A: 0.006 g (typ.)
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Supply voltage range
Symbol
Rating
Unit
V
−0.5 to 7
V
V
CC
DC input voltage
V
−0.5 to V
+ 0.5
IN
CC
CC
DC output voltage
Input diode current
Output diode current
DC output current
V
−0.5 to V
+ 0.5
V
OUT
I
±20
mA
mA
mA
mA
mW
°C
IK
I
±20
±12.5
±25
OK
I
OUT
DC V /ground current
CC
I
CC
Power dissipation
P
200
D
Storage temperature range
Lead temperature (10 s)
T
stg
−65 to 150
T
L
260
°C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
1
2009-09-30