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STK12C68_11 PDF预览

STK12C68_11

更新时间: 2022-09-24 17:04:22
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 存储静态存储器
页数 文件大小 规格书
24页 1629K
描述
64 Kbit (8K x 8) AutoStore nvSRAM 25 ns, 35 ns, and 45 ns access times

STK12C68_11 数据手册

 浏览型号STK12C68_11的Datasheet PDF文件第3页浏览型号STK12C68_11的Datasheet PDF文件第4页浏览型号STK12C68_11的Datasheet PDF文件第5页浏览型号STK12C68_11的Datasheet PDF文件第7页浏览型号STK12C68_11的Datasheet PDF文件第8页浏览型号STK12C68_11的Datasheet PDF文件第9页 
STK12C68  
The duty cycle of chip enable  
The overall cycle rate for accesses  
The ratio of Reads to Writes  
CMOS versus TTL input levels  
The operating temperature  
The VCC level  
Software RECALL  
Data is transferred from the nonvolatile memory to the SRAM by  
a software address sequence. A software RECALL cycle is  
initiated with a sequence of Read operations in a manner similar  
to the software STORE initiation. To initiate the RECALL cycle,  
the following sequence of CE controlled Read operations is  
performed:  
1. Read address 0x0000, Valid READ  
2. Read address 0x1555, Valid READ  
3. Read address 0x0AAA, Valid READ  
4. Read address 0x1FFF, Valid READ  
5. Read address 0x10F0, Valid READ  
6. Read address 0x0F0E, Initiate RECALL cycle  
I/O loading  
Figure 4. Current Versus Cycle Time (Read)  
Internally, RECALL is a two step procedure. First, the SRAM data  
is cleared; then, the nonvolatile information is transferred into the  
SRAM cells. After the tRECALL cycle time, the SRAM is again  
ready for Read and Write operations. The RECALL operation  
does not alter the data in the nonvolatile elements. The nonvol-  
atile data can be recalled an unlimited number of times.  
Data Protection  
The STK12C68 protects data from corruption during low voltage  
conditions by inhibiting all externally initiated STORE and Write  
operations. The low voltage condition is detected when VCC is  
less than VSWITCH. If the STK12C68 is in a Write mode (both CE  
and WE are low) at power up after a RECALL or after a STORE,  
the Write is inhibited until a negative transition on CE or WE is  
detected. This protects against inadvertent writes during power  
up or brown out conditions.  
Figure 5. Current Versus Cycle Time (Write)  
Noise Considerations  
The STK12C68 is a high speed memory. It must have a high  
frequency bypass capacitor of approximately 0.1 µF connected  
between VCC and VSS, using leads and traces that are as short  
as possible. As with all high speed CMOS ICs, careful routing of  
power, ground, and signals reduce circuit noise.  
Hardware Protect  
The STK12C68 offers hardware protection against inadvertent  
STORE operation and SRAM Writes during low voltage condi-  
tions. When VCAP<VSWITCH, all externally initiated STORE  
operations and SRAM Writes are inhibited. AutoStore can be  
completely disabled by tying VCC to ground and applying +5V to  
V
CAP. This is the AutoStore Inhibit mode; in this mode, STOREs  
Preventing Store  
are only initiated by explicit request using either the software  
sequence or the HSB pin.  
The STORE function is disabled by holding HSB high with a  
driver capable of sourcing 30 mA at a VOH of at least 2.2V,  
because it must overpower the internal pull down device. This  
device drives HSB LOW for 20 μs at the onset of a STORE.  
When the STK12C68 is connected for AutoStore operation  
Low Average Active Power  
CMOS technology provides the STK12C68 the benefit of  
drawing significantly less current when it is cycled at times longer  
than 50 ns. Figure 4 shows the relationship between ICC and  
Read or Write cycle time. Worst case current consumption is  
shown for both CMOS and TTL input levels (commercial temper-  
ature range, VCC = 5.5V, 100% duty cycle on chip enable). Only  
standby current is drawn when the chip is disabled. The overall  
average current drawn by the STK12C68 depends on the  
following items:  
(system VCC connected to VCC and a 68 μF capacitor on VCAP  
)
and VCC crosses VSWITCH on the way down, the STK12C68  
attempts to pull HSB LOW. If HSB does not actually get below  
VIL, the part stops trying to pull HSB LOW and abort the STORE  
attempt.  
Document Number: 001-51027 Rev. *C  
Page 6 of 24  
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