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STK12C68-5C25 PDF预览

STK12C68-5C25

更新时间: 2024-02-02 12:57:28
品牌 Logo 应用领域
其他 - ETC 静态存储器
页数 文件大小 规格书
13页 371K
描述
8K x 8 AutoStore⑩ nvSRAM QuantumTrap⑩ CMOS Nonvolatile Static RAM

STK12C68-5C25 技术参数

是否Rohs认证:不符合生命周期:Obsolete
包装说明:DIP, DIP28,.3Reach Compliance Code:unknown
ECCN代码:3A001.A.2.CHTS代码:8542.32.00.41
风险等级:5.21Is Samacsys:N
最长访问时间:25 nsJESD-30 代码:R-CDIP-T28
JESD-609代码:e0长度:35.56 mm
内存密度:65536 bit内存集成电路类型:NON-VOLATILE SRAM
内存宽度:8功能数量:1
端子数量:28字数:8192 words
字数代码:8000工作模式:ASYNCHRONOUS
最高工作温度:125 °C最低工作温度:-55 °C
组织:8KX8封装主体材料:CERAMIC, METAL-SEALED COFIRED
封装代码:DIP封装等效代码:DIP28,.3
封装形状:RECTANGULAR封装形式:IN-LINE
并行/串行:PARALLEL峰值回流温度(摄氏度):NOT SPECIFIED
电源:5 V认证状态:Not Qualified
筛选级别:38535Q/M;38534H;883B座面最大高度:4.14 mm
最大待机电流:0.0025 A子类别:SRAMs
最大压摆率:0.09 mA最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):4.5 V标称供电电压 (Vsup):5 V
表面贴装:NO技术:CMOS
温度等级:MILITARY端子面层:Tin/Lead (Sn85Pb15)
端子形式:THROUGH-HOLE端子节距:2.54 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:7.62 mmBase Number Matches:1

STK12C68-5C25 数据手册

 浏览型号STK12C68-5C25的Datasheet PDF文件第5页浏览型号STK12C68-5C25的Datasheet PDF文件第6页浏览型号STK12C68-5C25的Datasheet PDF文件第7页浏览型号STK12C68-5C25的Datasheet PDF文件第9页浏览型号STK12C68-5C25的Datasheet PDF文件第10页浏览型号STK12C68-5C25的Datasheet PDF文件第11页 
STK12C68  
DEVICE OPERATION  
The STK12C68 has two separate modes of opera-  
tion: SRAM mode and nonvolatile mode. In SRAM  
mode, the memory operates as a standard fast  
static RAM. In nonvolatile mode, data is transferred  
from SRAM to Nonvolatile Elements (the STORE  
operation) or from Nonvolatile Elements to SRAM  
(the RECALL operation). In this mode SRAM func-  
tions are disabled.  
POWER-UP RECALL  
During power up, or after any low-power condition  
(VCAP < VRESET), an internal RECALL request will be  
latched. When VCAP once again exceeds the sense  
voltage of VSWITCH, a RECALL cycle will automatically  
be initiated and will take tRESTORE to complete.  
If the STK12C68 is in a WRITE state at the end of  
power-up RECALL, the SRAM data will be corrupted.  
To help avoid this situation, a 10K Ohm resistor  
should be connected either between W and system  
VCC or between E and system VCC.  
NOISE CONSIDERATIONS  
The STK12C68 is a high-speed memory and so  
must have a high-frequency bypass capacitor of  
approximately 0.1µF connected between VCAP and  
VSS, using leads and traces that are as short as pos-  
sible. As with all high-speed CMOS ICs, normal care-  
ful routing of power, ground and signals will help  
prevent noise problems.  
SOFTWARE NONVOLATILE STORE  
The STK12C68 software STORE cycle is initiated by  
executing sequential E controlled READ cycles from  
six specific address locations. During the STORE  
cycle an erase of the previous nonvolatile data is  
first performed, followed by a program of the nonvol-  
atile elements. The program operation copies the  
SRAM data into nonvolatile memory. Once a STORE  
cycle is initiated, further input and output are dis-  
abled until the cycle is completed.  
SRAM READ  
The STK12C68 performs a READ cycle whenever E  
and G are low and W and HSB are high. The  
address specified on pins A0-12 determines which of  
the 8,192 data bytes will be accessed. When the  
READ is initiated by an address transition, the out-  
puts will be valid after a delay of tAVQV (READ cycle  
#1). If the READ is initiated by E or G, the outputs will  
be valid at tELQV or at tGLQV, whichever is later (READ  
cycle #2). The data outputs will repeatedly respond  
to address changes within the tAVQV access time with-  
out the need for transitions on any control input pins,  
and will remain valid until another address change or  
until E or G is brought high, or W or HSB is brought  
low.  
Because a sequence of READs from specific  
addresses is used for STORE initiation, it is impor-  
tant that no other READ or WRITE accesses inter-  
vene in the sequence, or the sequence will be  
aborted and no STORE or RECALL will take place.  
To initiate the software STORE cycle, the following  
READ sequence must be performed:  
1. Read address  
2. Read address  
3. Read address  
4. Read address  
5. Read address  
6. Read address  
0000 (hex)  
1555 (hex)  
0AAA (hex)  
1FFF (hex)  
10F0 (hex)  
0F0F (hex)  
Valid READ  
Valid READ  
Valid READ  
SRAM WRITE  
Valid READ  
Valid READ  
A WRITE cycle is performed whenever E and W are  
low and HSB is high. The address inputs must be  
stable prior to entering the WRITE cycle and must  
remain stable until either E or W goes high at the  
end of the cycle. The data on the common I/O pins  
DQ0-7 will be written into the memory if it is valid tDVWH  
before the end of a W controlled WRITE or tDVEH  
before the end of an E controlled WRITE.  
Initiate STORE cycle  
The software sequence must be clocked with E con-  
trolled READs.  
Once the sixth address in the sequence has been  
entered, the STORE cycle will commence and the  
chip will be disabled. It is important that READ cycles  
and not WRITE cycles be used in the sequence,  
although it is not necessary that G be low for the  
sequence to be valid. After the tSTORE cycle time has  
been fulfilled, the SRAM will again be activated for  
READ and WRITE operation.  
It is recommended that G be kept high during the  
entire WRITE cycle to avoid data bus contention on  
common I/O lines. If G is left low, internal circuitry  
will turn off the output buffers tWLQZ after W goes low.  
October 2003  
8
Document Control # ML0008 rev 0.4  

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