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SNJ54F30 PDF预览

SNJ54F30

更新时间: 2024-11-21 01:08:51
品牌 Logo 应用领域
德州仪器 - TI 输入元件
页数 文件大小 规格书
16页 777K
描述
8-INPUT POSITIVE-NAND GATES

SNJ54F30 数据手册

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SN54F30, SN74F30  
8-INPUT POSITIVE-NAND GATES  
SDFS043A – MARCH 1987 – REVISED OCTOBER 1993  
SN54F30 . . . J PACKAGE  
SN74F30 . . . D OR N PACKAGE  
(TOP VIEW)  
Package Options Include Plastic  
Small-Outline Packages, Ceramic Chip  
Carriers, and Standard Plastic and Ceramic  
300-mil DIPs  
A
B
V
CC  
NC  
1
2
3
4
5
6
7
14  
13  
12  
11  
10  
9
description  
C
H
These devices contain a single 8-input NAND  
gate. They perform the Boolean functions  
Y = A B C D E F G H or  
Y = A + B + C + D + E + F + G + H in positive logic.  
D
G
E
F
GND  
NC  
NC  
Y
8
The SN54F30 is characterized for operation over  
the full military temperature range of 55°C to  
125°C. The SN74F30 is characterized for  
operation from 0°C to 70°C.  
SN54F30 . . . FK PACKAGE  
(TOP VIEW)  
FUNCTION TABLE  
3
2
1
20 19  
18  
INPUTS  
A–H  
OUTPUT  
Y
C
NC  
D
H
4
5
6
7
8
NC  
G
17  
16  
15  
14  
All inputs H  
L
One or more inputs L  
H
NC  
E
NC  
NC  
9 10 11 12 13  
logic symbol  
1
&
A
2
B
3
NC – No internal connection  
C
4
D
8
5
Y
E
6
F
11  
G
12  
H
This symbol is in accordance with ANSI/IEEE Std 91-1984 and  
IEC Publication 617-12.  
logic diagram (positive logic)  
1
A
B
C
D
E
F
2
3
4
8
Y
5
6
11  
12  
G
H
Pin numbers shown are for the D, J, and N packages.  
Copyright 1993, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
2–1  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  

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