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SN74LVC1G08_09 PDF预览

SN74LVC1G08_09

更新时间: 2024-11-02 11:53:47
品牌 Logo 应用领域
德州仪器 - TI 输入元件
页数 文件大小 规格书
18页 737K
描述
SINGLE 2-INPUT POSITIVE-AND GATE

SN74LVC1G08_09 数据手册

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SN74LVC1G08  
SINGLE 2-INPUT POSITIVE-AND GATE  
www.ti.com  
SCES217TAPRIL 1999REVISED FEBRUARY 2007  
FEATURES  
Available in the Texas Instruments  
NanoFree™ Package  
Ioff Supports Partial-Power-Down Mode  
Operation  
Supports 5-V VCC Operation  
Latch-Up Performance Exceeds 100 mA Per  
JESD 78, Class II  
Inputs Accept Voltages to 5.5 V  
Max tpd of 3.6 ns at 3.3 V  
ESD Protection Exceeds JESD 22  
2000-V Human-Body Model (A114-A)  
200-V Machine Model (A115-A)  
Low Power Consumption, 10-µA Max ICC  
±24-mA Output Drive at 3.3 V  
1000-V Charged-Device Model (C101)  
DBV PACKAGE  
(TOP VIEW)  
DCK PACKAGE  
(TOP VIEW)  
DRL PACKAGE  
(TOP VIEW)  
1
2
3
5
4
A
B
VCC  
1
2
3
5
A
B
VCC  
1
2
3
5
4
VCC  
A
B
GND  
Y
4
GND  
Y
GND  
Y
DRY PACKAGE  
(TOP VIEW)  
YZP PACKAGE  
(BOTTOM VIEW)  
3
2
1
4
GND  
B
Y
1
2
3
6
5
4
A
B
VCC  
NC  
Y
5
A
VCC  
GND  
NC – No internal connection  
See mechanical drawings for dimensions.  
DESCRIPTION/ORDERING INFORMATION  
Y = A • B or Y = A + B  
The SN74LVC1G08 performs the Boolean function or  
in positive logic.  
NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the  
package.  
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs,  
preventing damaging current backflow through the device when it is powered down.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
NanoFree is a trademark of Texas Instruments.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 1999–2007, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  

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