SN74CBTD3861
10-BIT FET BUS SWITCH
WITH LEVEL SHIFTING
SCDS084G – JULY 1998 – REVISED JULY 2002
DB, DBQ, DGV, DW, OR PW PACKAGE
(TOP VIEW)
5-Ω Switch Connection Between Two Ports
TTL-Compatible Input Levels
Designed to Be Used in Level-Shifting
Applications
NC
A1
A2
A3
A4
A5
A6
A7
A8
V
CC
1
2
3
4
5
6
7
8
9
24
23
22
21
20
19
18
17
16
OE
B1
B2
B3
B4
B5
B6
B7
description/ordering information
The SN74CBTD3861 provides ten bits of
high-speed TTL-compatible bus switching. The
low on-state resistance of the switch allows
connections to be made with minimal propagation
delay. A diode to V
is integrated on the die to
CC
A9 10
15 B8
allow for level shifting from 5-V signals at the
device inputs to 3.3-V signals at the device
outputs.
A10
GND
B9
B10
11
12
14
13
The device is organized as one 10-bit switch with
a single output-enable (OE) input. When OE is
low, the switch is on, and port A is connected to
port B. When OE is high, the switch is open, and
the high-impedance state exists between the two
ports.
NC – No internal connection
ORDERING INFORMATION
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
†
PACKAGE
T
A
Tube
SN74CBTD3861DW
SN74CBTD3861DWR
SN74CBTD3861DBR
SN74CBTD3861DBQR
SN74CBTD3861PWR
SN74CBTD3861DGVR
SOIC – DW
SSOP – DB
CBTD3861
Tape and reel
Tape and reel
CC861
–40°C to 85°C
SSOP (QSOP) – DBQ Tape and reel
CBTD3861
CC861
TSSOP – PW
TVSOP – DGV
Tape and reel
Tape and reel
CC861
†
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines
are available at www.ti.com/sc/package.
FUNCTION TABLE
INPUT
FUNCTION
OE
L
A port = B port
Disconnect
H
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright 2002, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
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