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SLDS016A − DECEMBER 1985 − REVISED OCTOBER 1989
DW OR N PACKAGE
(TOP VIEW)
• Each Device Drives 12 Lines
• 60-V Output Voltage Swing Capability
• 25-mA Output Source Current Capability
• High-Speed Serially-Shifted Data Input
• TTL-Compatible Inputs
Q11
Q12
Q10
Q9
Q8
Q7
V
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
STROBE
SERIAL OUT
DATA IN
• Latches on All Driver Outputs
CC2
V
15 GND
CC1
description
14
13
12
11
CLOCK
Q6
Q5
Q4
Q3
LATCH ENABLE
The SN65512B and SN75512B are monolithic
†
Q1
Q2
BIDFET integrated circuits designed to drive a
dot matrix or segmented vacuum fluorescent
display.
‡
logic symbol
All device inputs are diode-clamped pnp inputs
and assume a high logic level when open
circuited. The nominal input threshold voltage is
1.5 V. Outputs are totem-pole structures formed
by an npn emitter-follower and double-diffused
MOS (DMOS) transistors.
TTL/VAC
FLUOR DISPLAY
8
3
LATCH ENABLE
STROBE
The device consists of a 12-bit shift register,
12 latches, and 12 output AND gates. Serial data
is entered into the shift register on the low-to-high
transition of CLOCK. When high, LATCH ENABLE
transfers the shift register contents to the outputs
of the 12 latches. The active-low STROBE input
enables all Q outputs. Serial data output from the
shift register can be used to cascade shift
registers. This output is not affected by LATCH
ENABLE or STROBE.
SRG12
C1/
7
5
CLOCK
DATA IN
9
10
11
12
13
14
17
18
19
20
1
2D
2D
2D
2D
2D
2D
2D
2D
2D
2D
2D
2D
3
3
3
3
3
3
3
3
3
3
3
3
Q1
Q2
Q3
Q4
The SN65512B is characterized for operation
from −40°C to 85°C. The SN75512B is
characterized for operation from 0°C to 70°C.
Q5
Q6
Q7
Q8
Q9
Q10
Q11
2
Q12
4
SERIAL OUT
‡
This symbol is in accordance with ANSI/IEEE Std 91-1984
and IEC Publication 617-12.
†BIDFET − Bipolar, double-diffused, N-channel and P-channel MOS transistors on same chip. This is a patented process.
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Copyright 1989, Texas Instruments Incorporated
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4−3
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