SN65518, SN75518
VACUUM FLUORESCENT DISPLAY DRIVERS
SLDS004B – MARCH 1983 – REVISED MAY 1990
N PACKAGE
(TOP VIEW)
• Each Device Drives 32 Lines
• 60-V Output Voltage Swing Capability
• 25-mA Output Source Current Capability
• High-Speed Serially Shifted Data Input
• Latches on All Driver Outputs
V
V
CC1
DATA IN
Q1
1
40
39
38
37
36
CC2
SERIAL OUT
Q32
2
3
Q31
Q2
4
description
Q30
Q3
5
Q29
6
35 Q4
The SN65518 and SN75518 are monolithic
BIDFET integrated circuits designed to drive a
dot matrix or segmented vacuum fluorescent
display.
7
34
33
32
31
30
29
28
27
26
25
24
23
22
21
Q28
Q5
†
8
Q27
Q6
9
Q26
Q7
10
11
12
13
14
15
16
17
18
19
20
Q25
Q8
Each device consists of a 32-bit shift register, 32
latches, and 32 output AND gates. Serial data is
entered into the shift register on the low-to-high
transition of CLOCK. While LATCH ENABLE is
high, parallel data is transferred to the output
buffers through a 32-bit latch. Data present in the
latch during the high-to-low transition of LATCH
ENABLE is latched. When STROBE is low, all Q
outputs are enabled. When STROBE is high, all Q
outputs are low.
Q24
Q9
Q23
Q10
Q22
Q11
Q21
Q12
Q20
Q13
Q19
Q14
Q18
Q15
Q17
Q16
STROBE
GND
LATCH ENABLE
CLOCK
Serial data output from the shift register may be
used to cascade additional devices. This output is
not affected by LATCH ENABLE or STROBE.
FN PACKAGE
(TOP VIEW)
The SN65518 is characterized for operation from
–40°C to 85°C. The SN75518 is characterized for
operation from 0°C to 70°C.
6 5
4
3
2 1 44 43 42 41 40
Q4
39
Q29
Q28
Q27
Q26
Q25
Q24
Q23
Q22
Q21
Q20
Q19
7
Q5
38
Q6
37
8
9
Q7
36
10
11
12
13
14
15
16
17
Q8
35
Q9
34
33
Q10
32 Q11
31
30
29
Q12
Q13
NC
18 19 20 21 22 23 24 25 26 27 28
NC – No internal connection
†BIDFET – Bipolar, double-diffused, N-channel and P-channel MOS transistors on same chip. This is a patented process.
Copyright 1990, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
4–1
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