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SN54LVTH16245AWD PDF预览

SN54LVTH16245AWD

更新时间: 2024-11-04 22:17:51
品牌 Logo 应用领域
德州仪器 - TI 输出元件
页数 文件大小 规格书
18页 491K
描述
3.3-V ABT 16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS

SN54LVTH16245AWD 技术参数

生命周期:Obsolete零件包装代码:DFP
包装说明:DFP,针数:48
Reach Compliance Code:unknown风险等级:5.46
其他特性:WITH DIRECTION CONTROL系列:LVT
JESD-30 代码:R-GDFP-F48长度:15.748 mm
负载电容(CL):50 pF逻辑集成电路类型:BUS TRANSCEIVER
位数:8功能数量:2
端口数量:2端子数量:48
最高工作温度:125 °C最低工作温度:-55 °C
输出特性:3-STATE输出极性:TRUE
封装主体材料:CERAMIC, GLASS-SEALED封装代码:DFP
封装形状:RECTANGULAR封装形式:FLATPACK
最大电源电流(ICC):5 mA传播延迟(tpd):4.6 ns
认证状态:Not Qualified座面最大高度:3.05 mm
最大供电电压 (Vsup):3.6 V最小供电电压 (Vsup):2.7 V
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:BICMOS温度等级:MILITARY
端子形式:FLAT端子节距:0.635 mm
端子位置:DUAL宽度:9.652 mm

SN54LVTH16245AWD 数据手册

 浏览型号SN54LVTH16245AWD的Datasheet PDF文件第2页浏览型号SN54LVTH16245AWD的Datasheet PDF文件第3页浏览型号SN54LVTH16245AWD的Datasheet PDF文件第4页浏览型号SN54LVTH16245AWD的Datasheet PDF文件第5页浏览型号SN54LVTH16245AWD的Datasheet PDF文件第6页浏览型号SN54LVTH16245AWD的Datasheet PDF文件第7页 
SN54LVTH16245A, SN74LVTH16245A  
3.3-V ABT 16-BIT BUS TRANSCEIVERS  
WITH 3-STATE OUTPUTS  
www.ti.com  
SCBS143QMAY 1992REVISED OCTOBER 2005  
FEATURES  
SN54LVTH16245A . . . WD PACKAGE  
SN74LVTH16245A . . . DGG, DGV, OR DL PACKAGE  
(TOP VIEW)  
Members of the Texas Instruments Widebus™  
Family  
State-of-the-Art Advanced BiCMOS  
Technology (ABT) Design for 3.3-V Operation  
and Low Static-Power Dissipation  
1
48  
47  
46  
45  
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
27  
26  
25  
1DIR  
1B1  
1B2  
GND  
1B3  
1B4  
1OE  
1A1  
1A2  
GND  
1A3  
1A4  
2
3
Support Mixed-Mode Signal Operation (5-V  
4
Input and Output Voltages With 3.3-V VCC  
)
5
Support Unregulated Battery Operation Down  
to 2.7 V  
6
7
V
CC  
V
CC  
Typical VOLP (Output Ground Bounce) <0.8 V  
at VCC = 3.3 V, TA = 25°C  
8
1B5  
1B6  
GND  
1B7  
1B8  
2B1  
2B2  
GND  
2B3  
2B4  
1A5  
1A6  
GND  
1A7  
1A8  
2A1  
2A2  
GND  
2A3  
2A4  
9
Distributed VCC and GND Pins Minimize  
High-Speed Switching Noise  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
Flow-Through Architecture Optimizes PCB  
Layout  
Ioff and Power-Up 3-State Support Hot  
Insertion  
Bus Hold on Data Inputs Eliminates the Need  
for External Pullup/Pulldown Resistors  
V
CC  
V
CC  
Latch-Up Performance Exceeds 500 mA Per  
JESD 17  
2B5  
2B6  
GND  
2B7  
2B8  
2DIR  
2A5  
2A6  
GND  
2A7  
2A8  
2OE  
ESD Protection Exceeds JESD 22  
– 2000-V Human-Body Model (A114-A)  
– 200-V Machine Model (A115-A)  
DESCRIPTION/ORDERING INFORMATION  
ORDERING INFORMATION  
TA  
PACKAGE(1)  
ORDERABLE PART NUMBER  
SN74LVTH16245AGRDR  
SN74LVTH16245AZRDR  
74LVTH16245ADLG4  
TOP-SIDE MARKING  
FBGA – GRD  
Tape and reel  
Tape and reel  
LL245A  
FBGA – ZRD (Pb-free)  
SSOP – DL  
LVTH16245A  
74LVTH16245ADLRG4  
SN74LVTH16245ADGGR  
74LVTH16245ADGGRE4  
74LVTH16245ADGGRG4  
SN74LVTH16245ADGVR  
74LVTH16245ADGVRE4  
SN74LVTH16245AKR  
–40°C to 85°C  
TSSOP – DGG  
TVSOP – DGV  
Tape and reel  
Tape and reel  
LVTH16245A  
LL245A  
VFBGA – GQL  
Tape and reel  
Tube  
LL245A  
VFBGA – ZQL (Pb-free)  
CFP – WD  
74LVTH16245AZQLR  
–55°C to 125°C  
SNJ54LVTH16245AWD  
SNJ54LVTH16245AWD  
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at  
www.ti.com/sc/package.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Widebus is a trademark of Texas Instruments.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 1992–2005, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
On products compliant to MIL-PRF-38535, all parameters are  
Instruments standard warranty. Production processing does not  
tested unless otherwise noted. On all other products, production  
necessarily include testing of all parameters.  
processing does not necessarily include testing of all parameters.  

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