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SN54LVT8996

更新时间： 2024-10-31 22:36:43
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德州仪器 - TI 双倍数据速率
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44页 714K
描述
3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS

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SN54LVT8996 数据手册

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SN54LVT8996, SN74LVT8996  
3.3-V 10-BIT ADDRESSABLE SCAN PORTS  
MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS  
SCBS686A – APRIL 1997 – REVISED DECEMBER 1999  
Members of the Texas Instruments (TI )  
Simple Addressing (Shadow) Protocol Is  
Received/Acknowledged on Primary TAP  
Broad Family of Testability Products  
Supporting IEEE Std 1149.1-1990 (JTAG)  
Test Access Port (TAP) and Boundary-Scan  
Architecture  
10-Bit Address Space Provides for up to  
1021 User-Specified Board Addresses  
Bypass (BYP) Pin Forces  
Primary-to-Secondary Connection Without  
Use of Shadow Protocols  
Extend Scan Access From Board Level to  
Higher Levels of System Integration  
Promote Reuse of Lower-Level  
(Chip/Board) Tests in System Environment  
Connect (CON) Pin Provides Indication of  
Primary-to-Secondary Connection  
While Powered at 3.3 V, Both the Primary  
and Secondary TAPs Are Fully 5-V Tolerant  
for Interfacing to 5-V and/or 3.3-V Masters  
and Targets  
High-Drive Outputs (–32-mA I , 64-mA I  
Support Backplane Interface at Primary and  
High Fanout at Secondary  
)
OH  
OL  
Latch-Up Performance Exceeds 100 mA Per  
JESD 78, Class II  
Switch-Based Architecture Allows Direct  
Connect of Primary TAP to Secondary TAP  
ESD Protection Exceeds JESD 22  
– 2000-V Human-Body Model (A114-A)  
– 200-V Machine Model (A115-A)  
Primary TAP Is Multidrop for Minimal Use of  
Backplane Wiring Channels  
– 1000-V Charged-Device Model (C101)  
Shadow Protocols Can Occur in Any of  
Test-Logic-Reset, Run-Test/Idle, Pause-DR,  
and Pause-IR TAP States to Provide for  
Board-to-Board Test and Built-In Self-Test  
Package Options Include Plastic  
Small-Outline (DW) and Thin Shrink  
Small-Outline (PW) Packages, Ceramic  
Chip Carriers (FK), and Ceramic DIPs (JT)  
SN54LVT8996 . . . JT PACKAGE  
SN74LVT8996 . . . DW OR PW PACKAGE  
(TOP VIEW)  
SN54LVT8996 . . . FK PACKAGE  
(TOP VIEW)  
A4  
A3  
A2  
A1  
A0  
A5  
A6  
A7  
A8  
A9  
V
CON  
STDI  
STCK  
STMS  
STDO  
STRST  
1
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
14  
13  
4
3
2
1 28 27 26  
25  
2
A1  
A0  
A8  
A9  
V
5
3
24  
23  
22  
6
4
BYP  
NC  
7
CC  
5
NC  
8
BYP  
GND  
PTDO  
PTCK  
PTMS  
PTDI  
PTRST  
6
GND  
PTDO  
21 CON  
9
CC  
7
20  
19  
STDI  
10  
8
PTCK 11  
STCK  
12 13 14 15 16 17 18  
9
10  
11  
12  
NC – No internal connection  
description  
The ’LVT8996 10-bit addressable scan ports (ASP) are members of the Texas Instruments SCOPE testability  
integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate  
testing of complex circuit assemblies. Unlike most SCOPE devices, the ASP is not a boundary-scannable  
device, rather, it applies TI’s addressable-shadow-port technology to the IEEE Std 1149.1-1990 (JTAG) test  
access port (TAP) to extend scan access beyond the board level.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SCOPE and TI are trademarks of Texas Instruments Incorporated.  
Copyright 1999, Texas Instruments Incorporated  
UNLESS OTHERWISE NOTED this document contains PRODUCTION  
DATA information current as of publication date. Products conform to  
specifications per the terms of Texas Instruments standard warranty.  
Production processing does not necessarily include testing of all  
parameters.  
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...44

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