5秒后页面跳转
捷配首页

Datasheet > SN54ABT18245A_06
SN54ABT18245A_06 PDF预览

SN54ABT18245A_06

更新时间： 2024-11-14 05:18:27
品牌 Logo 应用领域
德州仪器 - TI 总线收发器测试
页数 文件大小 规格书
32页 436K
描述
SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS

阅读下载

中文翻译

获取价格

SN54ABT18245A_06 数据手册

 浏览型号SN54ABT18245A_06的Datasheet PDF文件第2页浏览型号SN54ABT18245A_06的Datasheet PDF文件第3页浏览型号SN54ABT18245A_06的Datasheet PDF文件第4页浏览型号SN54ABT18245A_06的Datasheet PDF文件第5页浏览型号SN54ABT18245A_06的Datasheet PDF文件第6页浏览型号SN54ABT18245A_06的Datasheet PDF文件第7页 
SN54ABT18245A, SN74ABT18245A  
SCAN TEST DEVICES  
WITH 18-BIT BUS TRANSCEIVERS  
SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999  
SN54ABT18245A . . . WD PACKAGE  
SN74ABT18245A . . . DGG OR DL PACKAGE  
(TOP VIEW)  
Members of the Texas Instruments  
SCOPE Family of Testability Products  
Members of the Texas Instruments  
Widebus Family  
1DIR  
1B1  
1B2  
GND  
1B3  
1B4  
1
56 1OE  
Compatible With the IEEE Standard  
1149.1-1990 (JTAG) Test Access Port and  
Boundary-Scan Architecture  
2
55  
54  
53  
52  
51  
50  
49  
48  
47  
46  
45  
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
1A1  
1A2  
GND  
1A3  
1A4  
3
4
SCOPE Instruction Set  
5
– IEEE Standard 1149.1-1990 Required  
Instructions, CLAMP and HIGHZ  
– Parallel-Signature Analysis at Inputs  
– Pseudo-Random Pattern Generation  
From Outputs  
– Sample Inputs/Toggle Outputs  
– Binary Count From Outputs  
– Device Identification  
6
7
V
V
CC  
CC  
8
1B5  
1B6  
1B7  
GND  
1B8  
1B9  
2B1  
2B2  
2B3  
2B4  
GND  
2B5  
2B6  
2B7  
1A5  
1A6  
1A7  
GND  
1A8  
1A9  
2A1  
2A2  
2A3  
2A4  
GND  
2A5  
2A6  
2A7  
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
– Even-Parity Opcodes  
State-of-the-Art EPIC-ΙΙB BiCMOS Design  
Significantly Reduces Power Dissipation  
Packaged in Plastic Shrink Small-Outline  
(DL) and Thin Shrink Small-Outline (DGG)  
Packages and 380-mil Fine-Pitch Ceramic  
Flat (WD) Packages  
description  
V
V
CC  
CC  
2B8  
2B9  
GND  
2DIR  
TDO  
TMS  
2A8  
2A9  
GND  
2OE  
TDI  
The’ABT18245Ascantestdeviceswith18-bitbus  
transceivers are members of the Texas  
Instruments SCOPE  
testability integrated-  
circuit family. This family of devices supports IEEE  
Standard 1149.1-1990 boundary scan to facilitate  
testing of complex circuit-board assemblies. Scan  
access to the test circuitry is accomplished via the  
4-wire test access port (TAP) interface.  
TCK  
In the normal mode, these devices are 18-bit noninverting bus transceivers. They can be used either as two  
9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot  
samples of the data appearing at the device pins or to perform a self-test on the boundary-test cells. Activating  
the TAP in the normal mode does not affect the functional operation of the SCOPE bus transceivers.  
Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is  
allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. OE can  
be used to disable the device so that the buses are effectively isolated.  
In the test mode, the normal operation of the SCOPE bus transceivers is inhibited and the test circuitry is  
enabled to observe and control the input/output (I/O) boundary of the device. When enabled, the test circuitry  
performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SCOPE, Widebus, and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.  
Copyright 1999, Texas Instruments Incorporated  
On products compliant to MIL-PRF-38535, all parameters are tested  
unless otherwise noted. On all other products, production  
processing does not necessarily include testing of all parameters.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...32

中文翻译

下载PDF

与SN54ABT18245A_06相关器件

型号 品牌 获取价格 描述 数据表
SN54ABT18245A_08 TI

获取价格

 		SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS
SN54ABT18245AWD TI

获取价格

 		SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS
SN54ABT18245AWDR TI

获取价格

 		ABT SERIES, DUAL 9-BIT BOUNDARY SCAN TRANSCEIVER, TRUE OUTPUT, CDFP56, 0.380 INCH, FINE PI
SN54ABT18245WD TI

获取价格

 		ABT SERIES, DUAL 9-BIT BOUNDARY SCAN TRANSCEIVER, TRUE OUTPUT, CDFP56, 0.380 INCH, CERAMIC
SN54ABT18245WDR TI

获取价格

 		ABT SERIES, DUAL 9-BIT BOUNDARY SCAN TRANSCEIVER, TRUE OUTPUT, CDFP56, 0.380 INCH, CERAMIC
SN54ABT18502 TI

获取价格

 		SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER
SN54ABT18502_14 TI

获取价格

 		SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER
SN54ABT18502AHV TI

获取价格

 		ABT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CQFP68
SN54ABT18502HV TI

获取价格

 		SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER
SN54ABT18502HVR TI

获取价格

 		ABT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CQFP68, CERAMIC, QFP-68

与SN54ABT18245A_06相关文章

您还可以找


热门产品
PCB打样/小批量
铝基板
BOM智能配单
PCBA制造
钣金
精密CNC
模具注塑
薄膜开关
精选活动
PCBA打样特惠
四六层板品质升级
铝基板品质升级
一体化电子制造
DFM下载
服务支持
企业认证
产品展示
工厂展示
工艺能力
积分商城
关于捷配
捷配简介
企业文化
公司动态
人才招聘
联系我们
帮助中心
下单流程
付款流程
开票流程
常见问题
全球PCB制造服务专线 400-613-0088

工作时间：9:00-21:00

CEO邮箱：ceo@jiepei.com

投诉邮箱：tousu@jiepei.com

捷配网-微信公众号 微信公众号
捷配网-微信公众号 抖音公众号
资质认证：
合作快递：
支付方式：
Copyright © 2024 Jiepei.com Inc. All Rights Reserved. 版权所有:杭州捷配信息科技有限公司 浙公网安备 33010502006866号 浙ICP备10014259号-119 营业执照ICP证