生命周期: | Obsolete | 包装说明: | QFF, |
Reach Compliance Code: | unknown | 风险等级: | 5.84 |
其他特性: | WITH INDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION; WITH CLOCK ENABLE | 系列: | ABT |
JESD-30 代码: | S-GQFP-F68 | 长度: | 12.51 mm |
负载电容(CL): | 50 pF | 逻辑集成电路类型: | BOUNDARY SCAN REG BUS TRANSCEIVER |
位数: | 20 | 功能数量: | 1 |
端口数量: | 2 | 端子数量: | 68 |
最高工作温度: | 125 °C | 最低工作温度: | -55 °C |
输出特性: | 3-STATE | 输出极性: | TRUE |
封装主体材料: | CERAMIC, GLASS-SEALED | 封装代码: | QFF |
封装形状: | SQUARE | 封装形式: | FLATPACK |
最大电源电流(ICC): | 40 mA | 传播延迟(tpd): | 7.1 ns |
认证状态: | Not Qualified | 座面最大高度: | 3.86 mm |
最大供电电压 (Vsup): | 5.5 V | 最小供电电压 (Vsup): | 4.5 V |
标称供电电压 (Vsup): | 5 V | 表面贴装: | YES |
技术: | BICMOS | 温度等级: | MILITARY |
端子形式: | FLAT | 端子节距: | 0.635 mm |
端子位置: | QUAD | 宽度: | 12.51 mm |
Base Number Matches: | 1 |
型号 | 品牌 | 获取价格 | 描述 | 数据表 |
SN54ABT18640 | TI |
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SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS | |
SN54ABT18640WD | TI |
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SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS | |
SN54ABT18646 | TI |
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SCAN TEST DEVICE WITH 18-BIT TRANSCEIVERS AND REGISTERS | |
SN54ABT18646AHV | TI |
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ABT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CQFP68 | |
SN54ABT18646HV | TI |
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SCAN TEST DEVICE WITH 18-BIT TRANSCEIVERS AND REGISTERS | |
SN54ABT18646HVR | TI |
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ABT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CQFP68 | |
SN54ABT18652 | TI |
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SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | |
SN54ABT18652HV | TI |
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SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | |
SN54ABT2240A | TI |
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OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS | |
SN54ABT2240A_16 | TI |
获取价格 |
OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS |