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SN54ABT18504_08

更新时间: 2024-11-14 05:18:27
品牌 Logo 应用领域
德州仪器 - TI 总线收发器测试
页数 文件大小 规格书
34页 666K
描述
SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

SN54ABT18504_08 数据手册

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SN54ABT18504, SN74ABT18504  
SCAN TEST DEVICES WITH  
20-BIT UNIVERSAL BUS TRANSCEIVERS  
SCBS108B – AUGUST 1992 – REVISED JUNE 1993  
Members of the Texas Instruments  
SCOPE Instruction Set  
– IEEE Standard 1149.1-1990 Required  
Instructions, Optional INTEST, and  
P1149.1A CLAMP and HIGHZ  
– Parallel Signature Analysis at Inputs With  
Masking Option  
SCOPE Family of Testability Products  
Members of the Texas Instruments  
Widebus Family  
Compatible With the IEEE Standard  
1149.1-1990 (JTAG) Test Access Port and  
Boundary-Scan Architecture  
– Pseudo-Random Pattern Generation  
From Outputs  
UBT (Universal Bus Transceiver)  
Combines D-Type Latches and D-Type  
Flip-Flops for Operation in Transparent,  
Latched, or Clocked Mode  
– Sample Inputs/Toggle Outputs  
– Binary Count From Outputs  
– Device Identification  
– Even-Parity Opcodes  
Two Boundary-Scan Cells per I/O for  
Packaged in 64-Pin Plastic Thin Quad Flat  
Pack Using 0.5-mm Center-to-Center  
Spacings and 68-Pin Ceramic Quad Flat  
Pack Using 25-mil Center-to-Center  
Spacings  
Greater Flexibility  
State-of-the-Art EPIC-ΙΙB BiCMOS Design  
Significantly Reduces Power Dissipation  
SN54ABT18504 . . . HV PACKAGE  
(TOP VIEW)  
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2 1 68 67 66 65 64 63 62 61  
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A4  
A5  
A6  
GND  
A7  
A8  
A9  
A10  
NC  
B5  
B6  
B7  
GND  
B8  
B9  
B10  
V
CC  
NC  
V
B11  
B12  
B13  
B14  
GND  
B15  
B16  
B17  
CC  
A11  
A12  
A13  
GND  
A14  
A15  
A16  
27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43  
NC – No internal connection  
SCOPE, Widebus, UBT, and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.  
Copyright 1993, Texas Instruments Incorporated  
UNLESS OTHERWISE NOTED this document contains PRODUCTION  
DATA information current as of publication date. Products conform to  
specifications per the terms of Texas Instruments standard warranty.  
Production processing does not necessarily include testing of all  
parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  

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