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SN54ABT18245WDR PDF预览

SN54ABT18245WDR

更新时间： 2024-11-14 19:14:11
品牌 Logo 应用领域
德州仪器 - TI 信息通信管理输出元件逻辑集成电路
页数 文件大小 规格书
30页 422K
描述
ABT SERIES, DUAL 9-BIT BOUNDARY SCAN TRANSCEIVER, TRUE OUTPUT, CDFP56, 0.380 INCH, CERAMIC, FP-56

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SN54ABT18245WDR 技术参数

生命周期：Obsolete零件包装代码：DFP
包装说明：DFP,针数：56
Reach Compliance Code：unknownHTS代码：8542.39.00.01
风险等级：5.56其他特性：WITH DIRECTION CONTROL
系列：ABTJESD-30 代码：R-GDFP-F56
长度：18.288 mm负载电容（CL）：50 pF
逻辑集成电路类型：BOUNDARY SCAN BUS TRANSCEIVER位数：9
功能数量：2端口数量：2
端子数量：56最高工作温度：125 °C
最低工作温度：-55 °C输出特性：3-STATE
输出极性：TRUE封装主体材料：CERAMIC, GLASS-SEALED
封装代码：DFP封装形状：RECTANGULAR
封装形式：FLATPACK最大电源电流（ICC）：38 mA
传播延迟（tpd）：14 ns认证状态：Not Qualified
座面最大高度：3.05 mm最大供电电压 (Vsup)：5.5 V
最小供电电压 (Vsup)：4.5 V标称供电电压 (Vsup)：5 V
表面贴装：YES技术：BICMOS
温度等级：MILITARY端子形式：FLAT
端子节距：0.635 mm端子位置：DUAL
宽度：9.652 mmBase Number Matches：1

SN54ABT18245WDR 数据手册

 浏览型号SN54ABT18245WDR的Datasheet PDF文件第2页浏览型号SN54ABT18245WDR的Datasheet PDF文件第3页浏览型号SN54ABT18245WDR的Datasheet PDF文件第4页浏览型号SN54ABT18245WDR的Datasheet PDF文件第5页浏览型号SN54ABT18245WDR的Datasheet PDF文件第6页浏览型号SN54ABT18245WDR的Datasheet PDF文件第7页 
SN54ABT18245  
SCAN TEST DEVICE WITH 18-BIT BUS TRANSCEIVERS  
SGBS307A – AUGUST 1994 – REVISED JANUARY 1995  
SN54ABT18245 . . . WD PACKAGE  
• Member of the Texas Instruments SCOPE  
(TOP VIEW)  
Family of Testability Products  
• Member of the Texas Instruments  
1DIR  
1B1  
1B2  
GND  
1B3  
1B4  
1
56 1OE  
Widebus Family  
2
55  
54  
53  
52  
51  
50  
49  
48  
47  
46  
45  
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
1A1  
1A2  
GND  
1A3  
1A4  
• Compatible With the IEEE Standard  
1149.1-1990 (JTAG) Test Access Port and  
Boundary-Scan Architecture  
3
4
5
• SCOPE Instruction Set  
– IEEE Standard 1149.1-1990 Required  
Instructions, CLAMP and HIGHZ  
– Parallel-Signature Analysis at Inputs  
– Pseudo-Random Pattern Generation  
From Outputs  
6
7
V
V
CC  
CC  
8
1B5  
1B6  
1B7  
GND  
1B8  
1B9  
2B1  
2B2  
2B3  
2B4  
GND  
2B5  
2B6  
2B7  
1A5  
1A6  
1A7  
GND  
1A8  
1A9  
2A1  
2A2  
2A3  
2A4  
GND  
2A5  
2A6  
2A7  
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
– Sample Inputs/Toggle Outputs  
– Binary Count From Outputs  
– Device Identification  
– Even-Parity Opcodes  
• State-of-the-Art EPIC-ΙΙB BiCMOS Design  
Significantly Reduces Power Dissipation  
• Packaged in 380-mil Fine-Pitch  
Ceramic Flat Packages Using 25-mil  
Center-to-Center Spacings  
description  
V
V
CC  
CC  
2B8  
2B9  
GND  
2DIR  
TDO  
TMS  
2A8  
2A9  
GND  
2OE  
TDI  
The SN54ABT18245 scan test device with 18-bit  
bus transceivers is a member of the Texas  
InstrumentsSCOPE testability integrated circuit  
family. This family of devices supports IEEE  
Standard 1149.1-1990 boundary scan to facilitate  
testing of complex circuit-board assemblies. Scan  
access to the test circuitry is accomplished via the  
4-wire test access port (TAP) interface.  
TCK  
In the normal mode, this device contains 18-bit noninverting bus transceivers. It can be used either as two 9-bit  
transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples  
of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP  
in the normal mode does not affect the functional operation of the SCOPE bus transceivers.  
Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is  
allowed from the A bus to the B bus or from the B bus to the A bus depending upon the logic level at DIR. The  
output-enable (OE) can be used to disable the device so that the buses are effectively isolated.  
In the test mode, the normal operation of the SCOPE bus transceivers is inhibited and the test circuitry is  
enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs  
boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.  
SCOPE, Widebus, and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.  
Copyright 1995, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...30

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