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SBAS289E – JUNE 2003 – REVISED NOVEMBER 2004
Precision Analog-to-Digital Converter (ADC)
and Digital-to-Analog Converter (DAC)
with 8051 Microcontroller and Flash Memory
Peripheral Features
FEATURES
ANALOG FEATURES
● 16 DIGITAL I/O PINS
● ADDITIONAL 32-BIT ACCUMULATOR
● TWO 16-BIT TIMER/COUNTERS
● SYSTEM TIMERS
● PROGRAMMABLE WATCHDOG TIMER
● FULL DUPLEX USART
● BASIC SPI™
● BASIC I2C™
● POWER MANAGEMENT CONTROL
● INTERNAL CLOCK DIVIDER
● IDLE MODE CURRENT < 200µA
● STOP MODE CURRENT < 100nA
● DIGITAL BROWNOUT RESET
● ANALOG LOW VOLTAGE DETECT
● 20 INTERRUPT SOURCES
● 24-BITS NO MISSING CODES
● 22-BITS EFFECTIVE RESOLUTION AT 10Hz
Low Noise: 75nV
● PGA FROM 1 TO 128
● PRECISION ON-CHIP VOLTAGE REFERENCE
● 8 DIFFERENTIAL/SINGLE-ENDED CHANNELS
● ON-CHIP OFFSET/GAIN CALIBRATION
● OFFSET DRIFT: 0.02ppm/°C
● GAIN DRIFT: 0.5ppm/°C
● ON-CHIP TEMPERATURE SENSOR
● SELECTABLE BUFFER INPUT
● BURNOUT DETECT
● 8-BIT CURRENT DAC
DIGITAL FEATURES
Microcontroller Core
GENERAL FEATURES
● 8051-COMPATIBLE
● HIGH-SPEED CORE:
4 Clocks per Instruction Cycle
● DC TO 33MHz
● ON-CHIP OSCILLATOR
● PLL WITH 32kHz CAPABILITY
● SINGLE INSTRUCTION 121ns
● DUAL DATA POINTER
● PACKAGE: TQFP-48
● LOW POWER: 3mW
● INDUSTRIAL TEMPERATURE RANGE:
–40°C to +85°C
● POWER SUPPLY: 2.7V to 5.25V
APPLICATIONS
● INDUSTRIAL PROCESS CONTROL
● INSTRUMENTATION
Memory
● 4kB OR 8kB OF FLASH MEMORY
● FLASH MEMORY PARTITIONING
● ENDURANCE 1M ERASE/WRITE CYCLES,
100 YEAR DATA RETENTION
● LIQUID/GAS CHROMATOGRAPHY
● BLOOD ANALYSIS
● SMART TRANSMITTERS
● PORTABLE INSTRUMENTS
● WEIGH SCALES
● PRESSURE TRANSDUCERS
● INTELLIGENT SENSORS
● PORTABLE APPLICATIONS
● DAS SYSTEMS
● 128 BYTES DATA SRAM
● IN-SYSTEM SERIALLY PROGRAMMABLE
● FLASH MEMORY SECURITY
● 1kB BOOT ROM
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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