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RN1961CT PDF预览

RN1961CT

更新时间: 2024-01-14 22:15:29
品牌 Logo 应用领域
东芝 - TOSHIBA 驱动器开关
页数 文件大小 规格书
8页 198K
描述
Switching Applications Inverter Circuit Applications Interface Circuit Applications Driver Circuit Applications

RN1961CT 数据手册

 浏览型号RN1961CT的Datasheet PDF文件第2页浏览型号RN1961CT的Datasheet PDF文件第3页浏览型号RN1961CT的Datasheet PDF文件第4页浏览型号RN1961CT的Datasheet PDF文件第5页浏览型号RN1961CT的Datasheet PDF文件第6页浏览型号RN1961CT的Datasheet PDF文件第7页 
RN1961CT~RN1966CT  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process) (Bias Resistor built-in Transistor)  
RN1961CT,RN1962CT,RN1963CT  
RN1964CT,RN1965CT,RN1966CT  
Switching Applications  
Unit: mm  
Inverter Circuit Applications  
1.0±0.05  
0.15±0.03  
Interface Circuit Applications  
Driver Circuit Applications  
Two devices are incorporated into a fine pitch Small Mold (6 pin)  
package.  
Incorporating a bias resistor into a transistor reduces parts count.  
0.35±0.02  
0.35±0.02  
0.075±0.03  
0.7±0.03  
Reducing the parts count enable the manufacture of ever more  
compact equipment and save assembly cost.  
Complementary to RN2961CT to RN2966CT  
Equivalent Circuit and Bias Resistor Values  
(E1)  
1.EMITTER1  
2.EMITTER2  
3.BASE2  
4.COLLECTOR2  
5.BASE1  
(E2)  
(B2)  
(C2)  
(B1)  
(C1)  
C
Type No.  
R1 (kΩ)  
R2 (kΩ)  
6.COLLECTOR1  
CST6  
RN1961CT  
RN1962CT  
RN1963CT  
RN1964CT  
RN1965CT  
RN1966CT  
4.7  
10  
4.7  
10  
22  
47  
47  
47  
R1  
B
JEDEC  
JEITA  
22  
47  
TOSHIBA  
2-1K1A  
E
2.2  
4.7  
Weight: 1 mg (typ.)  
Equivalent Circuit  
(top view)  
Absolute Maximum Ratings (Ta = 25°C)  
(Q1, Q2 common)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
6
5
4
V
V
20  
20  
V
V
CBO  
CEO  
RN1961CT  
to 1966CT  
Q2  
Q1  
Collector-emitter voltage  
RN1961CT  
to 1964CT  
10  
5
1
2
3
V
V
EBO  
Emitter-base voltage  
RN1965CT,  
1966CT  
Collector current  
I
50  
50  
mA  
mW  
°C  
C
RN1961CT  
to  
RN1966CT  
Collector power dissipation  
Junction temperature  
Storage temperature range  
P (Note1)  
C
T
150  
j
T
stg  
55 to 150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note1: Total rating  
1
2009-04-14  

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