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RN1421_07 PDF预览

RN1421_07

更新时间: 2024-11-21 04:07:47
品牌 Logo 应用领域
东芝 - TOSHIBA 开关驱动PC
页数 文件大小 规格书
8页 548K
描述
Silicon NPN Epitaxial Type (PCT Process) Switching, Inverter Circuit, Interface Circuit And Driver Circuit Applications

RN1421_07 数据手册

 浏览型号RN1421_07的Datasheet PDF文件第2页浏览型号RN1421_07的Datasheet PDF文件第3页浏览型号RN1421_07的Datasheet PDF文件第4页浏览型号RN1421_07的Datasheet PDF文件第5页浏览型号RN1421_07的Datasheet PDF文件第6页浏览型号RN1421_07的Datasheet PDF文件第7页 
RN1421RN1427  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process)  
RN1421,RN1422,RN1423,RN1424  
RN1425,RN1426,RN1427  
Switching, Inverter Circuit, Interface Circuit  
And Driver Circuit Applications  
Unit: mm  
z High current type (I (max) = 800mA)  
C
z With built-in bias resistors  
z Simplify circuit design  
z Reduce a quantity of parts and manufacturing process  
z Low V  
(sat)  
CE  
z Complementary to RN2401~RN2406  
Equivalent Circuit and Bias Resister Values  
Type No.  
R1 (k)  
R2 (k)  
RN1421  
RN1422  
RN1423  
RN1424  
RN1425  
RN1426  
RN1427  
1
2.2  
4.7  
10  
1
2.2  
4.7  
10  
10  
10  
10  
JEDEC  
JEITA  
0.47  
1
SC-59  
2-3F1A  
TOSHIBA  
2.2  
Weight: 0.012 g (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
50  
50  
V
V
CBO  
CEO  
RN1421~1427  
Collector-emitter voltage  
RN1421~1424  
RN1425, 1426  
RN1427  
10  
Emitter-base voltage  
V
V
5
EBO  
6
Collector current  
I
800  
200  
150  
55~150  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
C
RN1421~1427  
T
j
T
stg  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2007-11-01  

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