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RN1421(TE85L,F) PDF预览

RN1421(TE85L,F)

更新时间: 2024-11-25 21:06:11
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
8页 552K
描述
Small Signal Bipolar Transistor

RN1421(TE85L,F) 技术参数

生命周期:Active包装说明:,
Reach Compliance Code:unknownFactory Lead Time:12 weeks
风险等级:5.75Base Number Matches:1

RN1421(TE85L,F) 数据手册

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RN1421RN1427  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process) (Bias Resistor built-in Transistor)  
RN1421, RN1422, RN1423, RN1424  
RN1425, RN1426, RN1427  
Switching, Inverter Circuit, Interface Circuit  
Unit: mm  
and Driver Circuit Applications  
z High current type (I (max) = 800mA)  
C
z With built-in bias resistors  
z Simplify circuit design  
z Reduce a quantity of parts and manufacturing process  
z Low V  
(sat)  
CE  
z Complementary to RN2421 to RN2427  
Equivalent Circuit and Bias Resister Values  
Type No.  
R1 (k)  
R2 (k)  
RN1421  
RN1422  
RN1423  
RN1424  
RN1425  
RN1426  
RN1427  
1
2.2  
4.7  
10  
1
2.2  
4.7  
10  
10  
10  
10  
S-Mini  
JEDEC  
JEITA  
TO-236MOD  
SC-59  
0.47  
1
TOSHIBA  
2-3F1A  
2.2  
Weight: 12 mg (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
50  
V
V
CBO  
CEO  
RN1421 to 1427  
Collector-emitter voltage  
50  
RN1421 to 1424  
RN1425, 1426  
RN1427  
10  
Emitter-base voltage  
V
V
5
6
EBO  
Collector current  
I
800  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
200  
C
RN1421 to 1427  
T
150  
j
T
stg  
55 to 150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Start of commercial production  
1988-03  
1
2014-03-01  

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