OPA656-DIE
www.ti.com
SBOS596 –MARCH 2012
WIDEBAND, UNITY-GAIN STABLE, FET-INPUT OPERATIONAL AMPLIFIER
Check for Samples: OPA656-DIE
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FEATURES
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Unity-Gain Bandwidth
Low Input Bias Current
Low Offset and Drift
Low DL
APPLICATIONS
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Wideband Photodiode Amplifiers
Sample-and-Hold Buffers
CCD Output Buffers
High Output Current
Low Input Voltage Noise
ADC Input Buffers
Wideband Precision Amplifiers
Test and Measurement Front Ends
DESCRIPTION
The OPA656 combines a very wideband, unity-gain stable, voltage-feedback op amp with a FET-input stage to
offer an ultra high dynamic-range amplifier for ADC (analog-to-digital converter) buffering and transimpedance
applications. Extremely low DC errors give good precision in optical applications.
The high unity-gain stable bandwidth and JFET input allows exceptional performance in high-speed, low-noise
integrators.
ORDERING INFORMATION(1)
PACKAGE
DESIGNATOR
PRODUCT
PACKAGE(2)
ORDERABLE PART NUMBER
PACKAGE QUANTITY
OPA656TDB1
OPA656TDB2
400
10
OPA656
TD
Bare die in waffle pack
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2012, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.