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NTHL030N120M3S PDF预览

NTHL030N120M3S

更新时间: 2023-09-03 20:36:44
品牌 Logo 应用领域
安森美 - ONSEMI /
页数 文件大小 规格书
8页 312K
描述
Silicon Carbide (SiC) MOSFET – EliteSiC, 29 mohm, 1200 V, M3S, TO-247-3L

NTHL030N120M3S 数据手册

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DATA SHEET  
www.onsemi.com  
Silicon Carbide (SiC)  
MOSFET – EliteSiC,  
29 mohm, 1200ꢀV, M3S,  
TO-247-3L  
V
R
MAX  
I MAX  
D
(BR)DSS  
DS(ON)  
1200 V  
39 mW @ 18 V  
73 A  
NCHANNEL MOSFET  
D
NTHL030N120M3S  
Features  
Typ. R  
Ultra Low Gate Charge (Q  
= 29 mW @ V = 18 V  
GS  
DS(on)  
G
= 107 nC)  
G(tot)  
High Speed Switching with Low Capacitance (C = 106 pF)  
oss  
100% Avalanche Tested  
S
This Device is Halide Free and RoHS Compliant with exemption 7a,  
PbFree 2LI (on second level interconnection)  
Typical Applications  
Solar Inverters  
Electric Vehicle Charging Stations  
UPS (Uninterruptible Power Supplies)  
Energy Storage Systems  
TO2473LD  
SMPS (Switch Mode Power Supplies)  
CASE 340CX  
MAXIMUM RATINGS (T = 25C unless otherwise noted)  
J
MARKING DIAGRAM  
Parameter  
DraintoSource Voltage  
GatetoSource Voltage  
Symbol  
Value  
Unit  
V
DSS  
1200  
10/+22  
3/+18  
V
V
V
V
GS  
Recommended Operation Values T <175C  
of GatetoSource Voltage  
V
GSop  
C
HL030N  
120M3S  
AYWWZZ  
Continuous Drain  
Current (Notes 1, 3)  
Steady  
State  
T =25C  
C
I
D
73  
313  
52  
A
W
A
Power Dissipation  
(Note 1)  
P
D
Continuous Drain  
Current (Notes 1, 3)  
Steady T =100C  
State  
I
D
C
Power Dissipation  
(Note 1)  
P
156  
193  
W
A
D
HL030N120M3S = Specific Device Code  
A
Y
= Assembly Location  
= Year  
Pulsed Drain Current  
(Note 2)  
T
C
= 25C  
I
DM  
WW = Work Week  
ZZ  
= Lot Traceability  
Operating Junction and Storage Temperature  
Range  
T , T  
55 to  
C  
A
J
stg  
+175  
Source Current (Body Diode)  
I
S
62  
ORDERING INFORMATION  
T
C
= 25C, V = 3 V  
GS  
Single Pulse DraintoSource Avalanche  
E
220  
270  
mJ  
C  
AS  
Device  
Package  
Shipping  
Energy (Note 4)  
NTHL030N120M3S  
TO2473L  
30 Units /  
Tube  
Maximum Lead Temperature for Soldering  
(1/25from case for 10 s)  
T
L
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
1. The entire application environment impacts the thermal resistance values shown,  
they are not constants and are only valid for the particular conditions noted.  
2. Repetitive rating, limited by max junction temperature.  
3. The maximum current rating is based on typical R  
performance.  
AS  
DS(on)  
4. EAS of 220 mJ is based on starting T = 25C; L = 1 mH, I = 21 A,  
J
V
= 100 V, V = 18 V.  
DD  
GS  
Semiconductor Components Industries, LLC, 2022  
1
Publication Order Number:  
April, 2023 Rev. 0  
NTHL030N120M3S/D  
 

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