NSS40200UW6T1G
40 V, 4.0 A, Low VCE(sat)
PNP Transistor
2
ON Semiconductor’s e PowerEdge family of low V
CE(sat)
transistors are miniature surface mount devices featuring ultra low
saturation voltage (V ) and high current gain capability. These
are designed for use in low voltage, high speed switching applications
where affordable efficient energy control is important.
CE(sat)
http://onsemi.com
Typical applications are DC−DC converters and power management
in portable and battery powered products such as cellular and cordless
phones, PDAs, computers, printers, digital cameras and MP3 players.
Other applications are low voltage motor controls in mass storage
products such as disc drives and tape drives. In the automotive
industry they can be used in air bag deployment and in the instrument
−40 VOLTS
4.0 AMPS
PNP LOW VCE(sat) TRANSISTOR
EQUIVALENT RDS(on) 100 mW
2
cluster. The high current gain allows e PowerEdge devices to be
COLLECTOR
1, 2, 5, 6
driven directly from PMU’s control outputs, and the Linear Gain
(Beta) makes them ideal components in analog amplifiers.
• This is a Pb−Free Device
3
BASE
MAXIMUM RATINGS (T = 25°C)
A
Rating
Symbol
Max
−40
Unit
Vdc
Vdc
Vdc
Adc
A
4
EMITTER
Collector-Emitter Voltage
Collector-Base Voltage
Emitter-Base Voltage
V
CEO
V
CBO
V
EBO
−40
E
C
−7.0
−2.0
−4.0
Collector Current − Continuous
Collector Current − Peak
Electrostatic Discharge
I
WDFN6
C
CASE 506AP
I
CM
ESD
HBM Class 3B
MM Class C
Pin 1
THERMAL CHARACTERISTICS
Characteristic
MARKING DIAGRAM
Symbol
Max
Unit
1
2
3
6
5
4
Total Device Dissipation, T = 25°C
P
(Note 1)
875
7.0
mW
mW/°C
A
D
VA MG
Derate above 25°C
G
Thermal Resistance,
Junction−to−Ambient
R
q
(Note 1)
143
°C/W
JA
VA = Specific Device Code
M
G
= Date Code
= Pb−Free Package
Total Device Dissipation, T = 25°C
P
(Note 2)
D
1.5
11.8
W
mW/°C
A
Derate above 25°C
(Note: Microdot may be in either location)
Thermal Resistance,
Junction−to−Ambient
R
R
(Note 2)
(Note 2)
85
°C/W
°C/W
W
q
JA
ORDERING INFORMATION
Thermal Resistance,
Junction−to−Lead #1
23
q
JL
†
Device
Package
Shipping
Total Device Dissipation
(Single Pulse < 10 sec)
P
3.0
Dsingle
WDFN6
(Pb−Free)
3000/
NSS40200UW6T1G
(Notes 2 & 3)
Tape & Reel
Junction and Storage
Temperature Range
T , T
−55 to
+150
°C
J
stg
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
2
1. FR−4 @ 100 mm , 1 oz copper traces.
2
2. FR−4 @ 500 mm , 1 oz copper traces.
3. Thermal response.
©
Semiconductor Components Industries, LLC, 2006
1
Publication Order Number:
September, 2006 − Rev. 0
NSS40200UW6/D