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NE76184A-TI PDF预览

NE76184A-TI

更新时间: 2024-09-30 03:46:43
品牌 Logo 应用领域
日电电子 - NEC /
页数 文件大小 规格书
4页 53K
描述
GENERAL PURPOSE L TO X-BAND GaAs MESFET

NE76184A-TI 数据手册

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GENERAL PURPOSE  
L TO X-BAND GaAs MESFET  
NE76184AS  
NOISE FIGURE & ASSOCIATED  
FEATURES  
GAIN vs. FREQUENCY  
VDS = 3 V, IDS = 10 mA  
LOW NOISE FIGURE:  
4
3.5  
3
24  
21  
18  
0.8 dB typical at 4 GHz  
HIGH ASSOCIATED GAIN:  
12 dB typical at 4 GHz  
G
A
LG = 1.0 µm, WG = 400 µm  
2.5  
2
15  
12  
9
LOW COST METAL/CERAMIC PACKAGE  
TAPE & REEL PACKAGING OPTION AVAILABLE  
1.5  
1
6
NF  
DESCRIPTION  
3
0
0.5  
0
NE76184AS is a high performance gallium arsenide metal  
semiconductor field effect transistor housed in an epoxy-  
sealed, metal/ceramic package. Its low noise figure makes  
this device appropriate for use in the second or third stages of  
low noise amplifiers operating in the 1-12 GHz frequency  
range. The device is fabricated using ion implantation for  
improved RF and DC performance, reliability, and uniformity.  
The NE76184AS is suitable for DBS, TVRO, GPS and other  
commercial applications.  
1
10  
20  
Frequency, f (GHz)  
NEC's stringent quality assurance and test procedures en-  
sure the highest reliability and performance.  
ELECTRICAL CHARACTERISTICS (TA = 25°C)  
PART NUMBER  
PACKAGE OUTLINE  
NE76184AS  
84AS  
SYMBOL  
PARAMETERS AND CONDITIONS  
UNITS  
MIN  
TYP  
MAX  
NF1  
Noise Figure at VDS = 3 V, ID = 10 mA, f = 4 GHz  
Associated Gain at VDS = 3 V, ID = 10 mA, f = 4 GHz  
dB  
dB  
0.8  
1.4  
1
GA  
12.0  
P1dB  
Output Power at 1 dB Gain Compression Point, f = 4 GHz  
VDS = 3 V, IDS = 10 mA  
dBm  
dBm  
12.5  
15.0  
VDS = 3 V, IDS = 30 mA  
G1dB  
Gain at P1dB, f = 4 GHz  
VDS = 3 V, IDS = 10 mA  
VDS = 3 V, IDS = 30 mA  
dB  
dB  
11.5  
13.5  
IDSS  
VP  
Saturated Drain Current at VDS = 3 V, VGS = 0  
Pinch Off Voltage at VDS = 3 V, ID = 100 µA  
Transconductance at VDS = 3 V, ID = 10 mA  
Gate to Source Leak Current at VGS = -5 V  
Thermal Resistance  
mA  
V
30  
-3.0  
20  
60  
-1.1  
45  
100  
-0.5  
gm  
mS  
µA  
IGSO  
RTH  
10  
°C/W  
300  
Note:  
1. Typical values of noise figures and associated gain are those obtained when 50% of the devices from a large number of lots were individually  
measured in a circuit with the input individually tuned to obtain the minimum value. Maximum values are criteria established on the production line  
as a "go-no-go" screening test with the fixture tuned for the "generic" type but not for each specimen.  
California Eastern Laboratories  

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