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NE32484AS PDF预览

NE32484AS

更新时间: 2024-11-09 03:46:43
品牌 Logo 应用领域
日电电子 - NEC 晶体晶体管放大器
页数 文件大小 规格书
5页 55K
描述
ULTRA LOW NOISE PSEUDOMORPHIC HJ FET

NE32484AS 数据手册

 浏览型号NE32484AS的Datasheet PDF文件第2页浏览型号NE32484AS的Datasheet PDF文件第3页浏览型号NE32484AS的Datasheet PDF文件第4页浏览型号NE32484AS的Datasheet PDF文件第5页 
ULTRA LOW NOISE  
PSEUDOMORPHIC HJ FET  
NE32484A  
NOISE FIGURE & ASSOCIATED  
FEATURES  
GAIN vs. FREQUENCY  
VDS = 2 V, IDS = 10 mA  
• VERY LOW NOISE FIGURE:  
0.6 dB typical at 12 GHz  
1.4  
1.2  
24  
21  
• HIGH ASSOCIATED GAIN:  
11 dB typical at 12 GHz  
G
A
• LG = 0.25 µm, WG = 200 µm  
1
18  
15  
• LOW COST METAL/CERAMIC PACKAGE  
• TAPE & REEL PACKAGING OPTION AVAILABLE  
0.8  
NF  
0.6  
0.4  
12  
9
DESCRIPTION  
The NE32484A is a pseudomorphic Hetero-Junction FET that  
uses the junction between Si-doped AlGaAs and undoped  
InGaAs to create very high mobility electrons. The device  
features mushroom shaped TiAl gates for decreased gate  
resistance and improved power handling capabilities. The  
mushroom gate also results in lower noise figure and high  
associated gain. This device is housed in an epoxy-sealed,  
metal/ceramic package and is intended for high volume  
consumer and industrial applications.  
0.2  
0
6
3
1
10  
20  
30  
Frequency, f (GHz)  
NEC's stringent quality assurance and test procedures as-  
sure the highest reliability and performance.  
ELECTRICAL CHARACTERISTICS (TA = 25°C)  
PART NUMBER  
PACKAGE OUTLINE  
NE32484A  
84AS  
SYMBOLS  
PARAMETERS AND CONDITIONS  
UNITS  
MIN  
TYP  
MAX  
NFOPT1  
Noise Figure, VDS = 2.0 V, ID = 10 mA,  
f = 12 GHz  
dB  
dB  
0.6  
0.7  
GA1  
Associated Gain, VDS = 2.0 V, ID = 10 mA, f = 12 GHz  
10.0  
11.0  
P1dB  
Output Power at 1 dB Gain Compression Point, f = 12 GHz  
VDS = 2.0 V, IDS = 10 mA  
dBm  
dBm  
8.5  
11.0  
VDS = 2.0 V, IDS = 20 mA  
G1dB  
Gain at P1dB, f = 12 GHz  
VDS = 2.0 V, IDS = 10 mA  
VDS = 2.0 V, IDS = 20 mA  
dB  
dB  
10.0  
10.5  
IDSS  
VP  
Saturated Drain Current, VDS = 2.0 V, VGS = 0 V  
Pinch-off Voltage, VDS = 2.0 V, IDS = 0.1 mA  
Transconductance, VDS = 2.0 V, ID = 10 mA  
Gate to Source Leakage Current, VGS = -3.0 V, ID = 0 mA  
Thermal Resistance (Channel to Ambient)  
Thermal Resistance (Channel to Case)  
mA  
V
15  
-2.0  
45  
40  
-0.8  
60  
70  
-0.2  
gm  
mS  
IGSO  
µA  
0.5  
750  
10.0  
350  
RTH (CH-A)  
RTH (CH-C)  
°C/W  
°C/W  
Note:  
1. Typical values of noise figures and associated gain are those obtained when 50% of the devices from a large number of lots were individually  
measured in a circuit with the input individually tuned to obtain the minimum value. Maximum values are criteria established on the production line  
as a "go-no-go" screening tuned for the "generic" type but not for each specimen.  
California Eastern Laboratories  

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