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NDS356AP

更新时间: 2024-11-17 22:29:07
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD 晶体小信号场效应晶体管开关光电二极管
页数 文件大小 规格书
6页 81K
描述
P-Channel Logic Level Enhancement Mode Field Effect Transistor

NDS356AP 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Transferred零件包装代码:SSOT
包装说明:SMALL OUTLINE, R-PDSO-G3针数:3
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8541.21.00.95风险等级:5.3
其他特性:LOGIC LEVEL COMPATIBLE配置:SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压:30 V最大漏极电流 (Abs) (ID):1.1 A
最大漏极电流 (ID):1.1 A最大漏源导通电阻:0.2 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJESD-30 代码:R-PDSO-G3
JESD-609代码:e3湿度敏感等级:1
元件数量:1端子数量:3
工作模式:ENHANCEMENT MODE最高工作温度:150 °C
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:SMALL OUTLINE峰值回流温度(摄氏度):NOT SPECIFIED
极性/信道类型:P-CHANNEL最大功率耗散 (Abs):0.5 W
认证状态:Not Qualified子类别:Other Transistors
表面贴装:YES端子面层:Matte Tin (Sn)
端子形式:GULL WING端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED晶体管应用:SWITCHING
晶体管元件材料:SILICONBase Number Matches:1

NDS356AP 数据手册

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September 1996  
NDS356AP  
P-Channel Logic Level Enhancement Mode Field Effect Transistor  
General Description  
Features  
SuperSOTTM-3  
P-Channel logic level enhancement mode  
-1.1 A, -30 V, RDS(ON) = 0.3 W @ VGS=-4.5 V  
power field effect transistors are produced using Fairchild's  
proprietary, high cell density, DMOS technology. This very high  
density process is especially tailored to minimize on-state  
resistance. These devices are particularly suited for low voltage  
applications such as notebook computer power management,  
portable electronics, and other battery powered circuits where  
RDS(ON) = 0.2 W @ VGS=-10 V.  
Industry standard outline SOT-23 surface mount package  
using proprietary SuperSOTTM-3 design for superior  
thermal and electrical capabilities.  
High density cell design for extremely low RDS(ON)  
.
fast high-side switching, and low in-line power loss  
needed in a very small outline surface mount package.  
are  
Exceptional on-resistance and maximum DC current  
capability.  
________________________________________________________________________________  
D
S
G
Absolute Maximum Ratings  
TA = 25°C unless otherwise noted  
Symbol Parameter  
NDS356AP  
-30  
Units  
VDSS  
VGSS  
ID  
Drain-Source Voltage  
V
V
A
Gate-Source Voltage - Continuous  
±20  
Maximum Drain Current - Continuous  
- Pulsed  
(Note 1a)  
±1.1  
±10  
Maximum Power Dissipation  
(Note 1a)  
(Note 1b)  
0.5  
W
PD  
0.46  
Operating and Storage Temperature Range  
-55 to 150  
°C  
TJ,TSTG  
THERMAL CHARACTERISTICS  
Thermal Resistance, Junction-to-Ambient (Note 1a)  
250  
75  
°C/W  
°C/W  
R
JA  
q
Thermal Resistance, Junction-to-Case  
(Note 1)  
R
JC  
q
© 1997 Fairchild Semiconductor Corporation  
NDS356AP Rev.C1  

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