MX26L12711MC
128M[x16] SINGLE3VPAGEMODEMTPMEMORY
FEATURES
• 3.0V to 3.6V operation voltage
• High Performance
• 128Mb density with two banks controled by BE0, BE1
• Block Structure
- 64 x 64Kword Erase Blocks for each bank
• Fast random / page mode access time
- 100/30 ns Read AccessTime (page depth:8-word)
• 16-WordWrite Buffer
- Block erase time: 2s typ.
- Byte programming time: 210us typ.
- Block programming time: 0.8s typ. (using Write to
Buffer Command)
• Program/Erase Endurance cycles: 10 cycles
- 14 us/word Effective Programming Time
Packaging
- 44-Lead SOP
Performance
• Low power dissipation
Technology
- typical 15mA active current for page mode read
- 160uA/(max.) standby current
- Two bits per cell Nbit (0.25u) MTP Technology
GENERAL DESCRIPTION
The MXIC's Nbit technology reliably stores memory con-
tents even after the specific erase and program cycles.
The MXIC cell is designed to optimize the erase and
program mechanisms by utilizing the dielectric's charac-
ter to trap or release charges from ONO layer.
The MXIC's MX26L12711MC MTP use the most advance
2 bits/cell Nbit technology, double the storage capacity
of memory cell.The device provide the high density MTP
memory solution with reliable performance and most cost-
effective.
The device organized as by 16 bits of output bus. The
device is packaged in 44-Lead SOP. It is designed to be
reprogrammed and erased in system or in standard
EPROM programmers.
The device uses a 3.0V to 3.6V VCC supply to perform
the High Reliability Erase and auto Program/Erase algo-
rithms.
The highest degree of latch-up protection is achieved
with MXIC's proprietary non-epi process. Latch-up pro-
tection is proved for stresses up to 100 milliamps on
address and data pin from -1V to VCC + 1V.
The device offers fast access time and allowing opera-
tion of high-speed microprocessors without wait states.
The device augment EPROM functionality with in-circuit
electrical erasure and programming.The device uses a
command register to manage this functionality.
P/N:PM0986
REV. 1.0, OCT. 29, 2003
1