MJL3281A (NPN)
MJL1302A (PNP)
Preferred Devices
Complementary Bipolar
Power Transistors
Features
http://onsemi.com
• Exceptional Safe Operating Area
• NPN/PNP Gain Matching within 10% from 50 mA to 5 A
• Excellent Gain Linearity
• High BVCEO
15 AMPERES
COMPLEMENTARY
SILICON POWER
TRANSISTORS
260 VOLTS
• High Frequency
• Pb−Free Packages are Available
Benefits
• Reliable Performance at Higher Powers
200 WATTS
• Symmetrical Characteristics in Complementary Configurations
• Accurate Reproduction of Input Signal
• Greater Dynamic Range
MARKING DIAGRAM
• High Amplifier Bandwith
Applications
• High−End Consumer Audio Products
♦Home Amplifiers
MJLxxxxA
AYYWWG
1
2
♦Home Receivers
3
• Professional Audio Amplifiers
♦Theater and Stadium Sound Systems
♦Public Address Systems (PAs)
TO−264
CASE 340G
STYLE 2
1
3
BASE
EMITTER
2 COLLECTOR
xxxx
A
YY
WW
G
= 3281 or 1302
= Location Code
= Year
= Work Week
= Pb−Free Package
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
J
Rating
Collector−Emitter Voltage
Collector−Base Voltage
Emitter−Base Voltage
Symbol
Value
260
260
5.0
Unit
Vdc
Vdc
Vdc
Vdc
Adc
V
CEO
V
CBO
V
EBO
ORDERING INFORMATION
Collector−Emitter Voltage − 1.5 V
V
CEX
260
Device
Package
Shipping
Collector Current − Continuous
− Peak (Note 1)
I
C
15
25
MJL3281A
TO−264
25 Units/Rail
25 Units/Rail
Base Current − Continuous
I
B
1.5
Adc
MJL3281AG
TO−264
(Pb−Free)
Total Power Dissipation @ T = 25°C
P
D
200
Watts
C
Derate Above 25°C
1.43
W/°C
MJL1302A
TO−264
25 Units/Rail
25 Units/Rail
Operating and Storage Junction
Temperature Range
T , T
−ꢀ 65 to
+150
°C
J
stg
MJL1302AG
TO−264
(Pb−Free)
THERMAL CHARACTERISTICS
Characteristic
Symbol
Max
Unit
Preferred devices are recommended choices for future use
and best overall value.
Thermal Resistance, Junction−to−Case
R
0.625
°C/W
θ
JC
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
1. Pulse Test: Pulse Width = 5 ms, Duty Cycle < 10%.
© Semiconductor Components Industries, LLC, 2005
1
Publication Order Number:
October, 2005 − Rev. 9
MJL3281A/D