5秒后页面跳转
K4E640812E-JP500 PDF预览

K4E640812E-JP500

更新时间: 2024-01-30 15:46:15
品牌 Logo 应用领域
三星 - SAMSUNG 动态存储器光电二极管内存集成电路
页数 文件大小 规格书
21页 193K
描述
EDO DRAM, 8MX8, 50ns, CMOS, PDSO32,

K4E640812E-JP500 技术参数

是否Rohs认证: 不符合生命周期:Active
包装说明:SOJ, SOJ32,.44Reach Compliance Code:compliant
风险等级:5.83最长访问时间:50 ns
I/O 类型:COMMONJESD-30 代码:R-PDSO-J32
内存密度:67108864 bit内存集成电路类型:EDO DRAM
内存宽度:8端子数量:32
字数:8388608 words字数代码:8000000
最高工作温度:85 °C最低工作温度:-40 °C
组织:8MX8输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:SOJ
封装等效代码:SOJ32,.44封装形状:RECTANGULAR
封装形式:SMALL OUTLINE电源:3.3 V
认证状态:Not Qualified刷新周期:4096
自我刷新:YES最大待机电流:0.001 A
子类别:DRAMs最大压摆率:0.11 mA
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子形式:J BEND端子节距:1.27 mm
端子位置:DUALBase Number Matches:1

K4E640812E-JP500 数据手册

 浏览型号K4E640812E-JP500的Datasheet PDF文件第1页浏览型号K4E640812E-JP500的Datasheet PDF文件第2页浏览型号K4E640812E-JP500的Datasheet PDF文件第4页浏览型号K4E640812E-JP500的Datasheet PDF文件第5页浏览型号K4E640812E-JP500的Datasheet PDF文件第6页浏览型号K4E640812E-JP500的Datasheet PDF文件第7页 
Industrial Temperature  
K4E660812E,K4E640812E  
CMOS DRAM  
ABSOLUTE MAXIMUM RATINGS  
Parameter  
Voltage on any pin relative to VSS  
Voltage on VCC supply relative to V SS  
Storage Temperature  
Symbol  
VIN, VOUT  
VCC  
Rating  
-0.5 to +4.6  
-0.5 to +4.6  
-55 to +150  
1
Units  
V
V
Tstg  
°C  
Power Dissipation  
PD  
W
Short Circuit Output Current  
IOS Address  
50  
mA  
* Permanent device damage may occur if "ABSOLUTE MAXIMUM RATINGS" are exceeded. Functional operation should be restricted to  
the conditions as detailed in the operational sections of this data sheet. Exposure to absolute maximum rating conditions for extended  
periods may affect device reliability.  
RECOMMENDED OPERATING CONDITIONS (Voltage referenced to Vss, TA= -40 to 85°C)  
Parameter  
Supply Voltage  
Symbol  
VCC  
VSS  
Min  
3.0  
0
Typ  
Max  
3.6  
0
Units  
3.3  
V
V
V
V
Ground  
0
-
*1  
Input High Voltage  
Input Low Voltage  
VIH  
2.0  
Vcc+0.3  
0.8  
*2  
VIL  
-
-0.3  
*1 : Vcc+1.3V at pulse width£15ns which is measured at VCC  
*2 : -1.3 at pulse width£15ns which is measured at V SS  
DC AND OPERATING CHARACTERISTICS (Recommended operating conditions unless otherwise noted.)  
Parameter  
Symbol  
Min  
Max  
Units  
Input Leakage Current (Any input 0£VIN£VCC+0.3V,  
all other pins not under test=0 Volt)  
II(L)  
-5  
5
uA  
Output Leakage Current  
(Data out is disabled, 0V£VOUT£VCC)  
IO(L)  
-5  
5
uA  
Output High Voltage Level(IOH=-2mA)  
Output Low Voltage Level(IOL=2mA)  
VOH  
VOL  
2.4  
-
-
V
V
0.4  

与K4E640812E-JP500相关器件

型号 品牌 描述 获取价格 数据表
K4E640812E-JP50T SAMSUNG EDO DRAM, 8MX8, 50ns, CMOS, PDSO32,

获取价格

K4E640812E-JP600 SAMSUNG EDO DRAM, 8MX8, 60ns, CMOS, PDSO32,

获取价格

K4E640812E-JP60T SAMSUNG EDO DRAM, 8MX8, 60ns, CMOS, PDSO32,

获取价格

K4E640812E-TC/L SAMSUNG 8M x 8bit CMOS Dynamic RAM with Extended Data Out

获取价格

K4E640812E-TI450 SAMSUNG EDO DRAM, 8MX8, 45ns, CMOS, PDSO32,

获取价格

K4E640812E-TI45T SAMSUNG EDO DRAM, 8MX8, 45ns, CMOS, PDSO32,

获取价格