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JS28F064M29EWTA

更新时间: 2024-01-18 18:35:33
品牌 Logo 应用领域
镁光 - MICRON PC
页数 文件大小 规格书
132页 1301K
描述
Anticipating electrostatic discharge (ESD) technology roadmap trends with ESD control hardening precautions for the handling and assembly of semiconductor die, wafers, packages, and PCBs.

JS28F064M29EWTA 数据手册

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Micron Confidential and Proprietary  
4Gb, 8Gb, 16Gb: x8, x16 NAND Flash Memory  
General Description  
General Description  
Micron NAND Flash devices include an asynchronous data interface for high-perform-  
ance I/O operations. These devices use a highly multiplexed 8-bit bus (I/Ox) to transfer  
commands, address, and data. There are five control signals used to implement the  
asynchronous data interface: CE#, CLE, ALE, WE#, and RE#. Additional signals control  
hardware write protection and monitor device status (R/B#).  
This hardware interface creates a low pin-count device with a standard pinout that re-  
mains the same from one density to another, enabling future upgrades to higher densi-  
ties with no board redesign.  
A target is the unit of memory accessed by a chip enable signal. A target contains one or  
more NAND Flash die. A NAND Flash die is the minimum unit that can independently  
execute commands and report status. A NAND Flash die, in the ONFI specification, is  
referred to as a logical unit (LUN). There is at least one NAND Flash die per chip enable  
signal. For further details, see Device and Array Organization.  
This device has an internal 4-bit ECC that can be enabled using the GET/SET features.  
See Internal ECC and Spare Area Mapping for ECC for more information.  
Signal Descriptions  
Table 1: Signal Definitions  
Signal1  
Type  
Input  
Input  
Description2  
ALE  
Address latch enable: Loads an address from I/O[7:0] into the address register.  
CE#  
CE#2  
Chip enable: Enables or disables one or more die (LUNs) in a target.  
For the 16Gb device, CE# controls the first 8Gb of memory; CE2# controls the second 8Gb  
of memory.  
CLE  
Input  
Input  
Command latch enable: Loads a command from I/O[7:0] into the command register.  
LOCK  
When LOCK is HIGH during power-up, the BLOCK LOCK function is enabled. To disable the  
BLOCK LOCK, connect LOCK to VSS during power-up, or leave it disconnected (internal  
pull-down).  
RE#  
Input  
Input  
Read enable: Transfers serial data from the NAND Flash to the host system.  
WE#  
Write enable: Transfers commands, addresses, and serial data from the host system to the  
NAND Flash.  
WP#  
Input  
I/O  
Write protect: Enables or disables array PROGRAM and ERASE operations.  
I/O[7:0] (x8)  
Data inputs/outputs: The bidirectional I/Os transfer address, data, and command infor-  
I/O[15:0] (x16)  
mation.  
R/B#  
R/B#2  
Output  
Ready/busy: An open-drain, active-low output that requires an external pull-up resistor.  
This signal indicates target array activity.  
For the 16Gb device, R/B# indicates the status of the first 8Gb of memory; R/B# indicates  
the status of the second 8Gb of memory.  
VCC  
VSS  
Supply  
VCC: Core power supply  
Supply  
VSS: Core ground connection  
NC  
No connect: NCs are not internally connected. They can be driven or left unconnected.  
Do not use: DNUs must be left unconnected.  
DNU  
1. See Device and Array Organization for detailed signal connections.  
Notes:  
PDF: 09005aef83b25735  
m60a_4gb_8gb_16gb_ecc_nand.pdf - Rev. N 10/12 EN  
Micron Technology, Inc. reserves the right to change products or specifications without notice.  
8
© 2009 Micron Technology, Inc. All rights reserved.  

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