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ISL73040SEH PDF预览

ISL73040SEH

更新时间: 2023-12-20 18:44:29
品牌 Logo 应用领域
瑞萨 - RENESAS /
页数 文件大小 规格书
20页 1107K
描述
Radiation Hardened Low Side GaN FET Driver

ISL73040SEH 数据手册

 浏览型号ISL73040SEH的Datasheet PDF文件第1页浏览型号ISL73040SEH的Datasheet PDF文件第2页浏览型号ISL73040SEH的Datasheet PDF文件第3页浏览型号ISL73040SEH的Datasheet PDF文件第5页浏览型号ISL73040SEH的Datasheet PDF文件第6页浏览型号ISL73040SEH的Datasheet PDF文件第7页 
ISL70040SEH, ISL73040SEH  
1. Overview  
1.3  
Ordering Information  
Radiation Hardness  
(Total Ionizing Dose)  
Package  
(RoHS  
Compliant)  
Ordering SMD  
Number (Note 1)  
Package Temperature  
Part Number (Note 2)  
5962R1723301VXC ISL70040SEHVL  
HDR  
LDR  
Drawing  
Range  
100krad(Si) 75krad(Si) 8 Ld SMD  
100krad(Si) 75krad(Si) Die  
J8.A  
-55 to +125°C  
5962R1723301V9A  
ISL70040SEHVX (Note 3)  
-
N/A  
ISL70040SEHL/PROTO (Note 4)  
ISL70040SEHX/SAMPLE (Notes 3, 4)  
ISL73040SEHVL  
-
-
-
-
-
-
-
-
8 Ld SMD  
Die  
J8.A  
N/A  
-
J8.A  
-
5962L1723302VXC  
75krad(Si) 8 Ld SMD  
75krad(Si) Die  
5962L1723302V9A  
ISL73040SEHVX(Note 3)  
N/A  
N/A  
N/A  
N/A  
N/A  
ISL73040SEHL/PROTO (Note 4)  
ISL73040SEHX/SAMPLE (Notes 3, 4)  
ISL70040SEHEV2Z (Note 5)  
ISL70040SEHEV3Z (Note 5)  
ISL73040SEHEV4Z (Note 5)  
-
-
8 Ld SMD  
Die  
J8.A  
-
Evaluation Board with ISL70040SEH/ISL70023SEH  
Evaluation Board with ISL70040SEH/ISL70024SEH  
Half Bridge Power Stage using the ISL73040SEH, ISL73024SEH, and  
the ISL71610M  
N/A  
ISL70040SEHEV5Z (Note 5)  
Evaluation Board with ISL70040SEH/ISL70020SEH  
Notes:  
1. Specifications for Rad Hard QML devices are controlled by the Defense Logistics Agency Land and Maritime (DLA). The SMD  
numbers listed must be used when ordering.  
2. These Pb-free Hermetic packaged products employ 100% Au plate - e4 termination finish, which is RoHS compliant and compatible  
with both SnPb and Pb-free soldering operations.  
3. Die product tested at TA = + 25°C. The wafer probe test includes functional and parametric testing sufficient to make the die capable  
of meeting the electrical performance outlined in “Electrical Specifications” on page 7.  
4. The /PROTO and /SAMPLE are not rated or certified for Total Ionizing Dose (TID) or Single Event Effect (SEE) immunity. These  
parts are intended for engineering evaluation purposes only. The /PROTO parts meet the electrical limits and conditions across  
temperature specified in the DLA SMD and are in the same form and fit as the qualified device. The /SAMPLE parts are capable of  
meeting the electrical limits and conditions specified in the DLA SMD. The /SAMPLE parts do not receive 100% screening across  
temperature to the DLA SMD electrical limits. These part types do not come with a Certificate of Conformance because they are not  
DLA qualified devices.  
5. Evaluation board uses the /PROTO parts. The /PROTO parts are not rated or certified for Total Ionizing Dose (TID) or Single Event  
Effect (SEE) immunity.  
FN8984 Rev.10.0  
Jul 30, 2021  
Page 4 of 19  

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