5秒后页面跳转
IDT71V2577S80PFI9 PDF预览

IDT71V2577S80PFI9

更新时间: 2024-09-16 05:52:51
品牌 Logo 应用领域
艾迪悌 - IDT 静态存储器内存集成电路
页数 文件大小 规格书
22页 625K
描述
Cache SRAM, 128KX36, 8ns, CMOS, PQFP100, 14 X 20 MM, PLASTIC, TQFP-100

IDT71V2577S80PFI9 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:QFP包装说明:LQFP,
针数:100Reach Compliance Code:compliant
ECCN代码:3A991.B.2.AHTS代码:8542.32.00.41
风险等级:5.88最长访问时间:8 ns
其他特性:FLOW-THROUGH ARCHITECTUREJESD-30 代码:R-PQFP-G100
JESD-609代码:e0长度:20 mm
内存密度:4718592 bit内存集成电路类型:CACHE SRAM
内存宽度:36湿度敏感等级:3
功能数量:1端子数量:100
字数:131072 words字数代码:128000
工作模式:SYNCHRONOUS最高工作温度:85 °C
最低工作温度:-40 °C组织:128KX36
封装主体材料:PLASTIC/EPOXY封装代码:LQFP
封装形状:RECTANGULAR封装形式:FLATPACK, LOW PROFILE
并行/串行:PARALLEL峰值回流温度(摄氏度):240
认证状态:Not Qualified座面最大高度:1.6 mm
最大供电电压 (Vsup):3.465 V最小供电电压 (Vsup):3.135 V
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:TIN LEAD端子形式:GULL WING
端子节距:0.65 mm端子位置:QUAD
处于峰值回流温度下的最长时间:20宽度:14 mm
Base Number Matches:1

IDT71V2577S80PFI9 数据手册

 浏览型号IDT71V2577S80PFI9的Datasheet PDF文件第2页浏览型号IDT71V2577S80PFI9的Datasheet PDF文件第3页浏览型号IDT71V2577S80PFI9的Datasheet PDF文件第4页浏览型号IDT71V2577S80PFI9的Datasheet PDF文件第5页浏览型号IDT71V2577S80PFI9的Datasheet PDF文件第6页浏览型号IDT71V2577S80PFI9的Datasheet PDF文件第7页 
IDT71V2577S  
IDT71V2579S  
IDT71V2577SA  
IDT71V2579SA  
128K x 36, 256K x 18  
3.3V Synchronous SRAMs  
2.5V I/O, Flow-Through Outputs  
Burst Counter, Single Cycle Deselect  
Description  
Features  
The IDT71V2577/79 are high-speed SRAMs organized as  
128Kx36/256Kx18.TheIDT71V2577/79SRAMs containwrite,data,  
address andcontrolregisters.Therearenoregisters inthedataoutput  
path (flow-through architecture). Internal logic allows the SRAM to  
generateaself-timedwritebaseduponadecisionwhichcanbeleftuntil  
128K x 36, 256K x 18 memory configurations  
Supports fast access times:  
Commercial:  
– 7.5ns up to 117MHz clock frequency  
CommercialandIndustrial:  
– 8.0ns up to 100MHz clock frequency  
– 8.5ns up to 87MHz clock frequency  
LBO input selects interleaved or linear burst mode  
Self-timedwritecyclewithglobalwritecontrol(GW),bytewrite  
enable (BWE), and byte writes (BWx)  
3.3V core power supply  
Power down controlled by ZZ input  
2.5V I/O  
Optional - Boundary Scan JTAG Interface (IEEE 1149.1  
compliant)  
Packaged in a JEDEC Standard 100-pin plastic thin quad  
flatpack(TQFP),119ballgridarray(BGA)and165finepitchball  
grid array (fBGA)  
the endofthe write cycle.  
Theburstmodefeatureoffersthehighestlevelofperformancetothe  
systemdesigner,astheIDT71V2577/79canprovidefourcyclesofdata  
fora single address presentedtothe SRAM. Aninternalburstaddress  
counteracceptsthefirstcycleaddressfromtheprocessor,initiatingthe  
accesssequence.Thefirstcycleofoutputdatawillflow-throughfromthe  
arrayafteraclock-to-dataaccesstimedelayfromtherisingclockedgeof  
the same cycle. If burst mode operation is selected (ADV=LOW), the  
subsequentthreecyclesofoutputdatawillbeavailabletotheuseronthe  
next three rising clock edges. The order of these three addresses are  
definedbytheinternalburstcounterandthe LBO inputpin.  
The IDT71V2577/79 SRAMs utilize IDT’s latest high-performance  
CMOSprocessandarepackagedinaJEDECstandard14mmx20mm  
100-pinthinplasticquadflatpack(TQFP)aswellasa119ballgridarray  
(BGA) and a 165 fine pitch ball grid array (fBGA).  
PinDescriptionSummary  
A0-A17  
Address Inputs  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Synchronous  
Synchronous  
Synchronous  
Asynchronous  
Synchronous  
Synchronous  
Synchronous  
Chip Enable  
CE  
CS  
0
, CS  
1
Chip Selects  
Output Enable  
OE  
GW  
Global Write Enable  
Byte Write Enable  
Individual Byte Write Selects  
BWE  
BW , BW  
1
2
, BW  
3
, BW (1)  
4
CLK  
Clock  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Output  
Input  
Input  
I/O  
N/A  
Synchronous  
Synchronous  
Synchronous  
DC  
Burst Address Advance  
Address Status (Cache Controller)  
Address Status (Processor)  
Linear / Interleaved Burst Order  
Test Mode Select  
Test Data Input  
ADV  
ADSC  
ADSP  
LBO  
TMS  
TDI  
Synchronous  
Synchronous  
N/A  
TCK  
TDO  
Test Clock  
Test Data Output  
Synchronous  
Asynchronous  
Asynchronous  
Synchronous  
N/A  
JTAG Reset (Optional)  
Sleep Mode  
TRST  
ZZ  
I/O  
0
-I/O31, I/OP1-I/OP4  
DD, VDDQ  
SS  
Data Input / Output  
Core Power, I/O Power  
Ground  
V
Supply  
Supply  
V
N/A  
4877 tbl 01  
NOTE:  
1. BW3 and BW4 are not applicable for the IDT71V2579.  
JUNE 2003  
1
©2003ntegratedDeviceTechnology,Inc.  
DSC-4877/08  

与IDT71V2577S80PFI9相关器件

型号 品牌 获取价格 描述 数据表
IDT71V2577S85BG IDT

获取价格

128K x 36,256K x 18 3.3V Synchronous SRAMs 2.5V I/O,Flow-Through Outputs Burst Counter,Sin
IDT71V2577S85BG8 IDT

获取价格

Cache SRAM, 128KX36, 8.5ns, CMOS, PBGA119, BGA-119
IDT71V2577S85BGGI IDT

获取价格

Cache SRAM, 128KX36, 8.5ns, CMOS, PBGA119, BGA-119
IDT71V2577S85BGI IDT

获取价格

128K x 36,256K x 18 3.3V Synchronous SRAMs 2.5V I/O,Flow-Through Outputs Burst Counter,Sin
IDT71V2577S85BGI8 IDT

获取价格

Cache SRAM, 128KX36, 8.5ns, CMOS, PBGA119, BGA-119
IDT71V2577S85BQ IDT

获取价格

128K x 36,256K x 18 3.3V Synchronous SRAMs 2.5V I/O,Flow-Through Outputs Burst Counter,Sin
IDT71V2577S85BQG IDT

获取价格

Cache SRAM, 128KX36, 8.5ns, CMOS, PBGA165, FBGA-165
IDT71V2577S85BQGI IDT

获取价格

Cache SRAM, 128KX36, 8.5ns, CMOS, PBGA165, FBGA-165
IDT71V2577S85BQI IDT

获取价格

128K x 36,256K x 18 3.3V Synchronous SRAMs 2.5V I/O,Flow-Through Outputs Burst Counter,Sin
IDT71V2577S85PF IDT

获取价格

128K x 36,256K x 18 3.3V Synchronous SRAMs 2.5V I/O,Flow-Through Outputs Burst Counter,Sin